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100355 Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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100355 Datasheet(HTML) 4 Page - National Semiconductor (TI) |
4 / 10 page Absolute Maximum Ratings (Note 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Above which the useful life may be impaired. Storage Temperature (T STG) −65˚C to +150˚C Maximum Junction Temperature (T J) Ceramic +175˚C V EE Pin Potential to Ground Pin −7.0V to +0.5V Input Voltage (DC) V EE to +0.5V Output Current (DC Output HIGH) −50 mA ESD (Note 3) ≥2000V Recommended Operating Conditions Case Temperature (T C) Military −55˚C to +125˚C Supply Voltage (V EE) −5.7V to −4.2V Note 2: Absolute maximum ratings are those values beyond which the de- vice may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 3: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics V EE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C Symbol Parameter Min Max Units T C Conditions Notes V OH Output HIGH Voltage −1025 −870 mV 0˚C to +125˚C −1085 −870 mV −55˚C V IN = VIH (Max) Loading with (Notes 4, 5, 6) V OL Output LOW Voltage −1830 −1620 mV 0˚C to +125˚C or V IL (Min) 50 Ω to −2.0V −1830 −1555 mV −55˚C V OHC Output HIGH Voltage −1035 mV 0˚C to +125˚C −1085 mV −55˚C V IN = VIH (Min) Loading with (Notes 4, 5, 6) V OLC Output LOW Voltage −1610 mV 0˚C to +125˚C or V IL (Max) 50 Ω to −2.0V −1555 mV −55˚C V IH Input HIGH Voltage −1165 −870 mV −55˚C to Guaranteed HIGH Signal (Notes 4, 5, 6, 7) +125˚C for ALL Inputs V IL Input LOW Voltage −1830 −1475 mV −55˚C to Guaranteed LOW Signal (Notes 4, 5, 6, 7) +125˚C for ALL Inputs I IL Input LOW Current 0.50 µA −55˚C to V EE = −4.2V (Notes 4, 5, 6) +125˚C V IN = VIL (Min) I IH Input HIGH Current S 0,S1 220 E 1,E2 350 µA 0˚C to +125˚C D na–Dnd 340 V EE = −5.7V MR 430 V IN = VIH (Max) (Notes 4, 5, 6) S 0,S1 320 E 1,E2 500 µA −55˚C D na–Dnd 490 MR 630 I EE Power Supply Current −95 −32 mA −55˚C to +125˚C Inputs Open (Notes 4, 5, 6) Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 5: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C Temp., Subgroups 1, 2, 3, 7, and 8. Note 6: Sample tested (Method 5005, Table 1) on each Mfg. lot at +25˚, +125˚C, and −55˚C Temp., Subgroups 1, 2, 3, 7, and 8. Note 7: Guaranteed by applying specified input condition and testing VOH/VOL. www.national.com 4 |
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