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100364F Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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100364F Datasheet(HTML) 4 Page - National Semiconductor (TI) |
4 / 8 page Absolute Maximum Ratings (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Above which the useful life may be impaired Storage Temperature (T STG) −65˚C to +150˚C Maximum Junction Temperature (T J) Ceramic +175˚C Pin Potential to Ground Pin (V EE) −7.0V to +0.5V Input Voltage (DC) V EE to +0.5V Output Current (DC Output HIGH) −50 mA ESD (Note 2) ≥ 2000V Recommended Operating Conditions Case Temperature (T C) Military −55˚C to +125˚C Supply Voltage (V EE) −5.7V to −4.2V Note 1: Absolute maximum ratings are those values beyond which the de- vice may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics V EE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C Symbol Parameter Min Max Units T C Conditions Notes V OH Output HIGH Voltage −1025 −870 mV 0˚C to V IN = VIH (Max) Loading with (Notes 3, 4, 5) +125˚C or V IL (Min) 50 Ω to −2.0V −1085 −870 mV −55˚C V OL Output LOW Voltage −1830 −1620 mV 0˚C to +125˚C −1830 −1555 mV −55˚C V OHC Output HIGH Voltage −1035 mV 0˚C to V IN = VIH (Min) Loading with (Notes 3, 4, 5) +125˚C or V IL (Max) 50 Ω to −2.0V −1085 mV −55˚C V OLC Output LOW Voltage −1610 mV 0˚C to +125˚C −1555 mV −55˚C V IH Input HIGH Voltage −1165 −870 mV −55˚C to Guaranteed HIGH Signal (Notes 3, 4, 5, 6) +125˚C for All Inputs V IL Input LOW Voltage −1830 −1475 mV −55˚C to Guaranteed LOW Signal (Notes 3, 4, 5, 6) +125˚C for All Inputs I IL Input LOW Current 0.50 µA −55˚C to V EE = −4.2V (Notes 3, 4, 5) +125˚C V IN = VIL (Min) I IH Input HIGH Current 300 µA 0˚C to V EE = −5.7V (Notes 3, 4, 5) +125˚C V IN = VIH (Max) 450 µA −55˚C I EE Power Supply Current −95 −35 mA −55˚C to Inputs Open (Notes 3, 4, 5) +125˚C Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups, 1, 2, 3, 7 and 8. Note 5: Sampled tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7 and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL. www.national.com 4 |
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