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LPV521MG Datasheet(PDF) 8 Page - Texas Instruments |
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LPV521MG Datasheet(HTML) 8 Page - Texas Instruments |
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8 / 33 page  LPV521 SNOSB14D – AUGUST 2009 – REVISED DECEMBER 2014 www.ti.com 5-V DC Electrical Characteristics (continued) Unless otherwise specified, all limits for TA = 25°C, V + = 5 V, V− = 0 V, V CM = VO = V +/2, and R L > 1 MΩ. (1) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VO Output Swing High RL = 100 kΩ to V +/2 3 50 VIN(diff) = 100 mV Temperature extremes 50 mV from either rail Output Swing Low RL = 100 kΩ to V +/2 3 50 VIN (diff) = −100 mV Temperature extremes 50 IO Output Current Sourcing, VO to V − 15 23 VIN(diff) = 100 mV Temperature extremes 8 mA Sinking, VO to V + 15 22 VIN(diff) = −100 mV Temperature extremes 8 IS Supply Current VCM = 0.3 V 351 400 Temperature extremes 620 nA VCM = 4.7 V 475 600 Temperature extremes 870 6.10 5-V AC Electrical Characteristics (1) Unless otherwise specified, all limits for TA = 25°C, V + = 5 V, V− = 0 V, V CM = VO = V +/2, and R L > 1 MΩ. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT (2) (3) (2) GBW Gain-Bandwidth Product CL = 20 pF, RL = 100 kΩ 6.2 kHz SR Slew Rate AV = +1, Falling Edge 1.1 2.7 VIN = 0 V to 5 V Temperature 1.2 extremes V/ms Rising Edge 1.1 2.4 Temperature 1.2 extremes θ m Phase Margin CL = 20 pF, RL = 100 kΩ 73 deg Gm Gain Margin CL = 20 pF, RL = 100 kΩ 20 dB en Input-Referred Voltage Noise Density f = 100 Hz 255 nV/ √Hz Input-Referred Voltage Noise 0.1 Hz to 10 Hz 22 μVPP In Input-Referred Current Noise f = 100 Hz 100 fA/ √Hz EMIRR EMI Rejection Ratio, IN+ and IN −(4) VRF_PEAK = 100 mVP (−20 dBP), 121 f = 400 MHz VRF_PEAK = 100 mVP (−20 dBP), 121 f = 900 MHz dB VRF_PEAK = 100 mVP (−20 dBP), 124 f = 1800 MHz VRF_PEAK = 100 mVP (−20 dBP), 142 f = 2400 MHz (1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) All limits are guaranteed by testing, statistical analysis or design. (3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material. (4) The EMI Rejection Ratio is defined as EMIRR = 20log (VRF_PEAK/ ΔVOS). 8 Submit Documentation Feedback Copyright © 2009–2014, Texas Instruments Incorporated Product Folder Links: LPV521 |
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