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LM7321MF Datasheet(PDF) 8 Page - Texas Instruments |
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LM7321MF Datasheet(HTML) 8 Page - Texas Instruments |
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8 / 39 page  LM7321, LM7322 SNOSAW8E – MAY 2008 – REVISED SEPTEMBER 2015 www.ti.com ±5-V Electrical Characteristics (continued) Unless otherwise specified, all limited ensured for TA = 25°C, V + = 5 V, V− = −5V, V CM = 0 V, VOUT = 0 V, and RL > 1 MΩ to 0 V. (1) PARAMETER TEST CONDITION MIN(2) TYP(3) MAX(2) UNIT 1.0 1.3 LM7321 TA = –40°C to 2 +125°C IS Supply Current VCM = −4.5 V mA 2.3 2.8 LM7322 TA = –40°C to 3.8 +125°C SR Slew Rate(7) AV = +1, VI = 8-V Step 12.3 V/µs fu Unity Gain Frequency RL = 2 kΩ, CL = 20 pF 9 MHz GBW Gain Bandwidth f = 50 kHz 16 MHz Input Referred Voltage f = 2 kHz en 14.3 nV/ √H Noise Density Input Referred Current f = 2 kHz in 1.35 pA/ √H Noise Density Total Harmonic f = 1 kHz, RL = 100 kΩ, AV = +2 THD+N −79 dB Distortion + Noise VOUT = 8 VPP CT Rej. Crosstalk Rejection f = 100 kHz, Driver RL = 10 kΩ 60 dB (7) Slew rate is the slower of the rising and falling slew rates. Connected as a Voltage Follower. 7.7 ±15-V Electrical Characteristics Unless otherwise specified, all limited ensured for TA = 25°C, V + = 15 V, V− = −15 V, V CM = 0 V, VOUT = 0 V, and RL > 1 MΩ to 15 V. (1) PARAMETER TEST CONDITION MIN(2) TYP(3) MAX(2) UNIT −6 ±0.7 +6 VCM = −14.5 V and VOS Input Offset Voltage mV VCM = 14.5 V –40°C to +125°C −8 +8 Input Offset Voltage TC VOS VCM = −14.5 V and VCM = 14.5 V (4) ±2 µV/°C Temperature Drift −2 −1.1 VCM = −14.5 V (5) –40°C to +125°C −2.5 IB Input Bias Current µA 0.45 1 VCM = 14.5 V (5) –40°C to +125°C 1.5 30 300 VCM = −14.5 V and IOS Input Offset Current nA VCM = 14.5 V –40°C to +125°C 500 80 100 −15 V ≤ VCM ≤ 12 V –40°C to +125°C 75 Common-Mode Rejection CMRR dB Ratio 72 80 −15 V ≤ VCM ≤ 15 V –40°C to +125°C 70 78 100 Power Supply Rejection 2.7 V ≤ VS ≤ 30 V, VCM PSRR dB Ratio = −14.5 V –40°C to +125°C 74 (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) All limits are ensured by testing or statistical analysis. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change. (5) Positive current corresponds to current flowing into the device. 8 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: LM7321 LM7322 |
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