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LMP7300MA Datasheet(PDF) 6 Page - Texas Instruments |
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LMP7300MA Datasheet(HTML) 6 Page - Texas Instruments |
6 / 30 page LMP7300 SNOSAT7G – AUGUST 2007 – REVISED OCTOBER 2015 www.ti.com 6.6 Electrical Characteristics: 5-V Unless otherwise specified, all limits are ensured for TA = 25°C, V + = 5 V, V− = 0 V, and V CM = V +/2, R PULLUP = 100 kΩ, CLOAD = 10 pF. (1) PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT TA = 25°C 10 13 IS Supply Current RPULLUP = Open μA TJ = TA 18 COMPARATOR TA = 25°C ±0.07 ±0.75 VCM = V +/2 SOIC mV TJ = TA ±2 VOS Input Offset Voltage TA = 25°C ±0.07 ±1 VCM = V +/2 VSSOP mV TJ = TA ±2.2 TCVOS Input Offset Average Drift See(4) 1.8 μV/°C TA = 25°C 1.2 3 IB Input Bias Current(5) |VID| < 2.5 V nA TJ = TA 4 IOS Input Offset Current 0.15 0.5 nA Common Mode Rejection CMRR 1 ≤ VCM ≤ 5 V 80 100 dB Ratio Power Supply Rejection PSRR V+ = 2.7 V to 12 V 80 100 dB Ratio VOL Output Voltage Low ILOAD = 10 mA 0.25 0.4 V ILEAK Output Leakage Current Comparator Output in High State 1 pA 0 < Ref-VHYSTP,N < 25 mV 1 Hysteresis Control Voltage HCLIN mV/V Linearity 25 mV < Ref-VHYSTP,N < 100 mV 0.950 TA = 25°C 1.2 3 Hysteresis Leakage IHYS nA Current TJ = TA 4 Overdrive = 10 mV, CL = 10 pF 12 15 Propagation Delay TPD μs (High to Low) Overdrive = 100 mV, CL = 10 pF 4 7 REFERENCE SOIC 2.043 2.048 2.053 V VO Reference Voltage VSSOP 2.043 2.048 2.056 V Line Regulation VCC = 2.7 V to 12 V 14 80 μV/V Load Regulation IOUT = 0 to 1 mA 0.2 0.5 mV/mA TCVREF/° Temperature Coefficient −40°C to 125°C 55 ppm/°C C 0.1 Hz to 10 Hz 80 μVPP VN Output Noise Voltage 10 Hz to 10 kHz 100 μVRMS (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using statistical quality control (SQC) method. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) Offset voltage average drift determined by dividing the change in VOS at temperature extremes, by the total temperature change. (5) Positive current corresponds to current flowing into the device. 6 Submit Documentation Feedback Copyright © 2007–2015, Texas Instruments Incorporated Product Folder Links: LMP7300 |
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