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LMV393MX Datasheet(PDF) 5 Page - Texas Instruments |
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LMV393MX Datasheet(HTML) 5 Page - Texas Instruments |
5 / 38 page LMV331-N, LMV339-N, LMV393-N www.ti.com SNOS018H – AUGUST 1999 – REVISED DECEMBER 2014 2.7-V DC Electrical Characteristics (continued) Unless otherwise specified, all limits ensured for TJ = 25°C, V + = 2.7V, V− = 0V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT (1) (2) (1) IB Input Bias Current 10 250 nA At the temperature extremes 400 IOS Input Offset Current 5 50 nA At the temperature extremes 150 VCM Input Voltage Range −0.1 V 2.0 V VSAT Saturation Voltage ISINK ≤ 1 mA 120 mV IO Output Sink Current VO ≤ 1.5V 5 23 mA IS Supply Current LMV331-N 40 100 µA LMV393-N 70 140 µA Both Comparators LMV339-N 140 200 µA All four Comparators Output Leakage Current .003 µA At the temperature extremes 1 6.6 2.7-V AC Electrical Characteristics TJ = 25°C, V + = 2.7 V, R L = 5.1 kΩ, V − = 0 V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT (1) (2) (1) tPHL Propagation Delay (High to Low) Input Overdrive = 10 mV 1000 ns Input Overdrive = 100 mV 350 ns tPLH Propagation Delay (Low to High) Input Overdrive = 10 mV 500 ns Input Overdrive = 100 mV 400 ns (1) All limits are ensured by testing or statistical analysis. (2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. 6.7 5-V DC Electrical Characteristics Unless otherwise specified, all limits ensured for TJ = 25°C, V + = 5 V, V− = 0 V. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT (1) (2) (1) VOS Input Offset Voltage 1.7 7 mV At the temperature extremes 9 TCVOS Input Offset Voltage Average Drift 5 µV/°C IB Input Bias Current 25 250 nA At the temperature extremes 400 IOS Input Offset Current 2 50 nA At the temperature extremes 150 VCM Input Voltage Range −0.1 V 4.2 V AV Voltage Gain 20 50 V/mV (1) All limits are ensured by testing or statistical analysis. (2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. Copyright © 1999–2014, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: LMV331-N LMV339-N LMV393-N |
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