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INA333AIDGKTG4 Datasheet(PDF) 5 Page - Texas Instruments |
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INA333AIDGKTG4 Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 33 page  INA333 www.ti.com SBOS445C – JULY 2008 – REVISED DECEMBER 2015 6.5 Electrical Characteristics for VS = 1.8 V to 5.5 V at TA = 25°C, RL = 10 kΩ, VREF = VS / 2, and G = 1 (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INPUT(1) VOSI Offset voltage, RTI(2) ±10 ±25/G ±25 ±75/G μV vs temperature TA = –40°C to +125°C ±0.1 ±0.5 / G μV/°C PSR vs power supply 1.8 V ≤ VS ≤ 5.5 V ±1 ±5/G ±5 ±15/G μV/V Long-term stability See (3) Turnon time to specified VOSI TA = –40°C to +125°C See Typical Characteristics Impedance ZIN Differential 100 || 3 G Ω || pF ZIN Common-mode 100 || 3 G Ω || pF VCM Common-mode voltage range VO = 0 V (V–) + 0.1 (V+) – 0.1 V Common-mode rejection DC to 60 Hz VCM = (V–) + 0.1 V G = 1 80 90 dB to (V+) – 0.1 V VCM = (V–) + 0.1 V G = 10 100 110 dB CMR to (V+) – 0.1 V VCM = (V–) + 0.1 V G = 100 100 115 dB to (V+) – 0.1 V VCM = (V–) + 0.1 V G = 1000 100 115 dB to (V+) – 0.1 V INPUT BIAS CURRENT Input bias current ±70 ±200 pA IB vs temperature TA = –40°C to +125°C See Figure 26 pA/°C Input offset current ±50 ±200 pA IOS vs temperature TA = –40°C to +125°C See Figure 28 pA/°C INPUT VOLTAGE NOISE G = 100, RS = 0 Ω, f = 10 Hz 50 nV/ √Hz G = 100, RS = 0 Ω, f = 100 Hz 50 nV/ √Hz eNI Input voltage noise G = 100, RS = 0 Ω, f = 1 kHz 50 nV/ √Hz G = 100, RS = 0 Ω, f = 0.1 Hz to 10 Hz 1 μVPP f = 10 Hz 100 fA/ √Hz iN Input current noise f = 0.1 Hz to 10 Hz 2 pAPP GAIN G Gain equation 1 + (100 k Ω/RG) V/V Range of gain 1 1000 V/V VS = 5.5 V, (V–) + 100 mV ≤ VO ≤ (V+) – 100 mV G = 1 ±0.01% ±0.1% Gain error G = 10 ±0.05% ±0.25% G = 100 ±0.07% ±0.25% G = 1000 ±0.25% ±0.5% Gain vs temperature, G = 1 TA = –40°C to +125°C ±1 ±5 ppm/°C Gain vs temperature, G > 1(4) TA = –40°C to +125°C ±15 ±50 ppm/°C VS = 5.5 V, (V–) + 100 mV Gain nonlinearity ≤ VO ≤ (V+) – 100 mV Gain nonlinearity, G = 1 to 1000 RL = 10 kΩ 10 ppm OUTPUT Output voltage swing from rail VS = 5.5 V, RL = 10 kΩ See Figure 29 50 mV Capacitive load drive 500 pF ISC Short-circuit current Continuous to common –40, +5 mA (1) Total VOS, referred-to-input = (VOSI) + (VOSO / G) (2) RTI = Referred-to-input (3) 300-hour life test at 150°C demonstrated randomly distributed variation of approximately 1 μV (4) Does not include effects of external resistor RG Copyright © 2008–2015, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: INA333 |
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