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TCAN1042VDQ1 Datasheet(PDF) 4 Page - Texas Instruments |
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TCAN1042VDQ1 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 32 page 4 TCAN1042-Q1, TCAN1042V-Q1, TCAN1042H-Q1 TCAN1042HV-Q1, TCAN1042G-Q1, TCAN1042GV-Q1 TCAN1042HG-Q1, TCAN1042HGV-Q1 SLLSES9 – FEBRUARY 2016 www.ti.com Product Folder Links: TCAN1042-Q1 TCAN1042V-Q1 TCAN1042H-Q1 TCAN1042HV-Q1 TCAN1042G-Q1 TCAN1042GV-Q1 TCAN1042HG-Q1 TCAN1042HGV-Q1 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal. 7 Specifications 7.1 Absolute Maximum Ratings (1) (2) MIN MAX UNIT VCC 5V bus supply voltage range –0.3 +7 V VIO I/O Level Shifting Voltage Range Devices with the "V" suffix –0.3 +7 VBUS CAN Bus I/O voltage range (CANH, CANL) Devices without the "H" suffix -58 +58 VBUS CAN Bus I/O voltage range (CANH, CANL) Devices with the "H" suffix -70 +70 V(Logic_Input) Logic input terminal voltage range (TXD, STB) –0.3 +7 and VI ≤ VIO + 0.3 V(Logic_Output) Logic output terminal voltage range (RXD) –0.3 +7 and VI ≤ VIO + 0.3 IO(RXD) RXD (Receiver) output current -8 +8 mA TJ Operating virtual junction temperature range (see Thermal Information) –55 150 °C (1) Tested in accordance to JEDEC Standard 22, Test Method A114. (2) Test method based upon JEDEC Standard 22 Test Method A114, CAN bus is stressed with respect to GND. (3) Tested in accordance to JEDEC Standard 22, Test Method C101. (4) Tested in accordance to JEDEC Standard 22, Test Method A115. (5) ISO7637 is a system level transient test. Results given here are specific to the GIFT-ICT CAN EMC Test specification conditions. Different system level configurations may lead to different results. 7.2 ESD Ratings TEST CONDITIONS VALUE UNIT Human Body Model (HBM) ESD stress voltage All terminals(1) ±6000 V CAN bus terminals (CANH, CANL) to GND(2) ±10000 Charged Device Model (CDM) ESD stress voltage All terminals(3) ±750 V Machine Model (MM) All terminals(4) ±200 System Level Electro-Static Discharge (ESD) CAN bus terminals (CANH, CANL) to GND SAE J2962-2 per ISO 10605: Powered Air Discharge ±15000 V SAE J2962-2 per ISO 10605: Powered Contact Discharge ±8000 System Level Electro-Static Discharge (ESD) CAN bus terminals (CANH, CANL) to GND IEC 61400-4-2: Unpowered Air Discharge ±15000 V IEC 61400-4-2: Powered on Contact Discharge ±8000 ISO7637-2 Transients according to GIFT - ICT CAN EMC test specification(5) CAN bus terminals (CANH, CANL) to GND Pulse 1 –100 V Pulse 2 +75 Pulse 3a –150 Pulse 3b +100 ISO7637-3 Transients CAN bus terminals (CANH, CANL) to GND Direct Coupling Capacitor "Slow Transient Pulse" with 100nF coupling capacitor - Powered ±85 |
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