OUT

VDD

VSS

1

3

2

6

4

5

I

IN4

I

IN3

I

IN2

I

DD

V3

V1

V2

7

8

V4

I

IN1

CD

I

CELL

I

V(OUT)

V(VCELL)

OV Condition

≤ 170 ms

V(CD)

CD pin held low

11

bq2947

www.ti.com

SLUSB15E – SEPTEMBER 2012 – REVISED FEBRUARY 2016

Product Folder Links: bq2947

Submit Documentation Feedback

Copyright © 2012–2016, Texas Instruments Incorporated

Device Functional Modes (continued)

Figure 10 shows the timing for the Customer Test Mode.

Figure 10. Timing for Customer Test Mode

Figure 11 shows the measurement for current consumption of the product for both VDD and Vx.

Figure 11. Configuration for IC Current Consumption Test