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BQ294706DSGR Datasheet(PDF) 11 Page - Texas Instruments |
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BQ294706DSGR Datasheet(HTML) 11 Page - Texas Instruments |
11 / 24 page OUT VDD VSS 1 3 2 6 4 5 I IN4 I IN3 I IN2 I DD V3 V1 V2 7 8 V4 I IN1 CD I CELL I CELL = IDD + IIN1 + I IN2 + IIN3 + I IN4 V(OUT) V(VCELL) OV Condition ≤ 170 ms V(CD) CD pin held low 11 bq2947 www.ti.com SLUSB15E – SEPTEMBER 2012 – REVISED FEBRUARY 2016 Product Folder Links: bq2947 Submit Documentation Feedback Copyright © 2012–2016, Texas Instruments Incorporated Device Functional Modes (continued) Figure 10 shows the timing for the Customer Test Mode. Figure 10. Timing for Customer Test Mode Figure 11 shows the measurement for current consumption of the product for both VDD and Vx. Figure 11. Configuration for IC Current Consumption Test |
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