SW

PGND

8

9

VIN

1

HI

LI

4

5

HS

3

HB

2

VCC

6

AGND

7

LMG5200

Pattern

Generator

Delay Measurement

(A)

LMG5200

SNOSCY4B – MARCH 2015 – REVISED JANUARY 2016

www.ti.com

7 Parameter Measurement Information

7.1 Propagation Delay and Mismatch Measurement

Figure 5 shows the typical test setup used to measure the propagation mismatch. As the gate drives are not

accessible, pull-up and pull-down resistors in this test circuit are used to indicate when the low-side GaN FET

Resistance values used in this circuit for the pull-up and pull-down resistors are in the order of 1 k

Ω, the current

sources used are 2 A.

Figure 6 through Figure 8 show propagation delay measurement waveforms. For turn-on propagation delay

measurements, the current sources are not used. For turn-off time measurements, the current sources are set to

turn-off delay, the current source across the high-side FET is turned on, the current source across the low-side

side component turn-off propagation delay measurements, the high-side component current source is turned off

and the low-side component current source is turned on, LI transitions from high to low and the output transitions

delay time.

Figure 5. Propagation Delay and Propagation Mismatch Measurement

8

Submit Documentation Feedback

Copyright © 2015–2016, Texas Instruments Incorporated

Product Folder Links: LMG5200