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ADC08038CIWM Datasheet(PDF) 6 Page - National Semiconductor (TI) |
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ADC08038CIWM Datasheet(HTML) 6 Page - National Semiconductor (TI) |
6 / 24 page Leakage Current Test Circuit TRI-STATE Test Circuits and Waveforms Timing Diagrams DS010555-7 t 1H DS010555-38 DS010555-39 t 0H DS010555-40 DS010555-41 Data Input Timing DS010555-10 *To reset these devices, CLK and CS must be simultaneously high for a period of tSELECT or greater. Otherwise these devices are compatible with industry standards ADC0831/2/4/8. www.national.com 6 |
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