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BQ50002RHBR Datasheet(PDF) 5 Page - Texas Instruments |
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BQ50002RHBR Datasheet(HTML) 5 Page - Texas Instruments |
5 / 35 page bq50002 www.ti.com SLUSBW1A – OCTOBER 2015 – REVISED OCTOBER 2015 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT PVIN1, PVIN2 –0.3 7 V BOOT1 (2) –0.3 14 V VBOOT1 – VSW1 –0.3 7 V BOOT2 (2) –0.3 14 V VBOOT2 – VSW2 –0.3 7 V PWM1, PWM2, EN, CLK_OUT, MODE, –0.3 3.6 V PWM_CTRL DMIN1 –5 7 V DMIN2 –0.3 7 V CSN, CSP –0.3 7 V CSN to CSP -0.5 0.5 V Operating junction temperature, TJ –40 125 °C Storage temperature, Tstg –55 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) In normal use, BOOT1, BOOT2 voltage internally regulated. 6.2 ESD Ratings VALUE UNIT Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±1000 V V(ESD) Electrostatic discharge Charged-device model (CDM), per JEDEC specification JESD22-C101 ±500 V (2) (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT PVIN1, PVIN2 4.5 5 5.5 V PWM1, PWM2, EN, CLK_OUT, MODE, PWM_CTRL 0 3 3.3 V DMIN1 –0.3 5 V DMIN2 –0.3 5 V CBP3 BP3 ceramic capacitor 2.2 µF CPVIN1, PVIN1, PVIN2 ceramic capacitor 0.1 µF CPVIN2 CPVIN1, PVIN1, PVIN2 electrolytic capacitor 22 µF CPVIN2 CBOOT1, SW1-BOOT1, SW2-BOOT2 capacitor 0.1 µF CBOOT2 Copyright © 2015, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: bq50002 |
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