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UM807MBE Datasheet(PDF) 4 Page - Union Semiconductor, Inc. |
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UM807MBE Datasheet(HTML) 4 Page - Union Semiconductor, Inc. |
4 / 17 page ________________________________________________________________________ http://www.union-ic.com Rev.01 Jan.2015 4/17 UM807/821/822 Pin Description Pin Number Pin Name Function 1 GND Ground 2 RESET ______________ (UM807/821) Active-Low Push-Pull or Open-Drain Output. RESET ______________ changes from high to low when VCC drops below its reset threshold and remains low for the 240ms reset timeout period after VCC exceeds their reset threshold. RESET ______________ is one-shot pulsed low for the reset timeout period (140ms min) after the manual reset input is asserted longer than the specified setup period. For the open-drain output, use a pull-up resistor to VCC. See Figure 1. RESET (UM822) Active-High Push-Pull Output. RESET changes from low to high when VCC drops below its reset threshold and remains high for the 240ms reset timeout period after VCC exceeds their reset threshold. RESET is one-shot pulsed high for the reset timeout period (140ms min) after the manual reset input is asserted longer than the specified setup period. See Figure 1. 3 MR _______ Manual Reset Input, Active Low. Internal 22kΩ pull-up to VCC. Pull MR _______ low for the typical input pulse width (tMR) to one-shot pulse RESET _____________ for the reset pulse width (tPW). See Figure 2. 4 VCC +5V, +3.3V, or +3V Supply Voltage Absolute Maximum Ratings (Note 1) Symbol Parameter Value Unit VCC Supply Voltage -0.3 to +6.0 V RESET, RESET _____________ (push-pull) -0.3 to (VCC+0.3) RESET _____________ (open-drain) -0.3 to +6.0 MR _______ -0.3 to +6.0 ICC Input Current, VCC, MR _______ 20 mA IO Output Current, RESET, RESET _____________ 20 mA PD Continuous Power Dissipation (Derate 4mW/°C above 70°C) 320 mW TA Operating Temperature Range -40 to +105 °C TSTG Storage Temperature Range -65 to +160 °C Lead Temperature (soldering, 10s) +300 °C Note 1: Stresses beyond those listed under “Absolute maximum Ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications are not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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