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CY7C1049CV33
Document #: 38-05006 Rev. *C
Page 4 of 9
AC Test Loads and Waveforms[5]
90%
10%
3.0V
GND
90%
10%
ALL INPUT PULSES
3.3V
OUTPUT
30 pF
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
(b)
R 317
Ω
R2
351
Ω
Rise Time: 1 V/ns
Fall Time: 1 V/ns
30 pF*
OUTPUT
Z = 50
Ω
50
Ω
1.5V
(c)
(a)
3.3V
OUTPUT
5 pF
(d)
R 317
Ω
R2
351
Ω
8-, 10-ns devices:
12-, 15-ns devices:
High-Z characteristics:
AC Switching Characteristics[6] Over the Operating Range
Parameter
Description
-8[]
-10
-12
-15
Unit
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Read Cycle
tpower
[7]
VCC(typical) to the first access
1
111
µs
tRC
Read Cycle Time
8
10
12
15
ns
tAA
Address to Data Valid
810
12
15
ns
tOHA
Data Hold from Address Change
3
33
3
ns
tACE
CE LOW to Data Valid
810
12
15
ns
tDOE
OE LOW to Data Valid
4567
ns
tLZOE
OE LOW to Low-Z
0
000
ns
tHZOE
OE HIGH to High-Z[8, 9]
4567
ns
tLZCE
CE LOW to Low-Z[9]
3
333
ns
tHZCE
CE HIGH to High-Z[8, 9]
4567
ns
tPU
CE LOW to Power-up
0
000
ns
tPD
CE HIGH to Power-down
810
12
15
ns
Write Cycle[10, 11]
tWC
Write Cycle Time
8
10
12
15
ns
tSCE
CE LOW to Write End
6
78
10
ns
tAW
Address Set-up to Write End
6
78
10
ns
tHA
Address Hold from Write End
0
000
ns
tSA
Address Set-up to Write Start
0
000
ns
tPWE
WE Pulse Width
6
78
10
ns
tSD
Data Set-up to Write End
4
567
ns
tHD
Data Hold from Write End
0
000
ns
tLZWE
WE HIGH to Low-Z[9]
3
333
ns
tHZWE
WE LOW to High-Z[8, 9]
4567
ns
Notes:
5. AC characteristics (except High-Z) for all 8-ns and 10-ns parts are tested using the load conditions shown in Figure (a). All other speeds are tested using the
Thevenin load shown in Figure (b). High-Z characteristics are tested for all speeds using the test load shown in Figure (d).
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