ADS1130

SBAS458A – JUNE 2009 – REVISED SEPTEMBER 2012

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION

For the most current package and ordering information, see the Package Option Addendum at the end of this

document, or see the TI web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

ADS1130

UNIT

AVDD to AGND

–0.3 to +6

V

DVDD to DGND

–0.3 to +6

V

AGND to DGND

–0.3 to +0.3

V

100, momentary

mA

Input current

10, continuous

mA

Analog input voltage to AGND

–0.3 to AVDD + 0.3

V

Digital input voltage to DGND

–0.3 to DVDD + 0.3

V

Maximum junction temperature

+150

°C

Operating temperature range

–40 to +85

°C

Storage temperature range

–60 to +150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-

maximum-rated conditions for extended periods may affect device reliability.

2

Submit Documentation Feedback

Copyright © 2009–2012, Texas Instruments Incorporated

Product Folder Links: ADS1130