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AFE4400 Datasheet(PDF) 7 Page - Texas Instruments |
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AFE4400 Datasheet(HTML) 7 Page - Texas Instruments |
7 / 87 page AFE4400 www.ti.com SBAS601H – DECEMBER 2012 – REVISED JULY 2014 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT RX_ANA_SUP, RX_DIG_SUP to RX_ANA_GND, RX_DIG_GND –0.3 4 V TX_CTRL_SUP, LED_DRV_SUP to LED_DRV_GND –0.3 6 V RX_ANA_GND, RX_DIG_GND to LED_DRV_GND –0.3 0.3 V Analog inputs RX_ANA_GND – 0.3 RX_ANA_SUP + 0.3 V Digital inputs RX_DIG_GND – 0.3 RX_DIG_SUP + 0.3 V Minimum [6, TXP, TXN pins –0.3 V (LED_DRV_SUP + 0.3)] Input current to any pin except supply pins(2) ±7 mA Momentary ±50 mA Input current Continuous ±7 mA Operating temperature range 0 70 °C Maximum junction temperature, TJ 125 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing beyond the supply rails must be current-limited to 10 mA or less. 7.2 Handling Ratings MIN MAX UNIT Tstg Storage temperature range –60 150 °C Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all –1000 1000 pins(1) V(ESD) Electrostatic discharge V Charged device model (CDM), per JEDEC specification –250 250 JESD22-C101, all pins(2) (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Copyright © 2012–2014, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: AFE4400 |
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