VDD

V4

V3

V2

OUT

CD

VSS

V1

Cell 4

Cell 3

Cell 2

Cell 1

I

CC

I

IN

I

IN

I

IN

V(OUT)

V(VCELL)

OV Condition

≤ 170 ms

V(CD)

CD pin held low

bq771600, bq771601, bq771602

bq771604, bq771605, bq771611, bq771612

www.ti.com

SLUSAX0D – DECEMBER 2012 – REVISED JULY 2015

Device Functional Modes (continued)

CAUTION

Avoid exceeding any Absolute Maximum Voltages on any pins when placing the part

into Customer Test Mode. Also avoid exceeding Absolute Maximum Voltages for the

individual cell voltages (V4–V3), (V3–V2), (V2–V1), and (V1–VSS). Stressing the pins

beyond the rated limits may cause permanent damage to the device.

Figure 10 shows the timing for the Customer Test Mode.

Figure 10. Timing for Customer Test Mode

Figure 11 shows the measurement for current consumption for the product for both VDD and Vx.

Figure 11. Configuration for IC Current Consumption Test

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