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FDC2114QRGHRQ1 Datasheet(PDF) 6 Page - Texas Instruments |
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FDC2114QRGHRQ1 Datasheet(HTML) 6 Page - Texas Instruments |
6 / 61 page FDC2212, FDC2214, FDC2112, FDC2114 SNOSCZ5A – JUNE 2015 – REVISED JUNE 2015 www.ti.com 8.5 Electrical Characteristics Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V (1) PARAMETER TEST CONDITIONS(2) MIN(3) TYP(4) MAX(3) UNIT POWER VDD Supply voltage TA = –40°C to +125°C 2.7 3.6 V IDD Supply durrent (not including CLKIN = 10MHz(6) 2.1 mA sensor current)(5) IDDSL Sleep mode supply current(5) 35 60 µA ISD Shutdown mode supply current(5) 0.2 1 µA CAPACITIVE SENSOR CSENSORMAX Maximum sensor capacitance 1mH inductor, 10kHz oscillation 250 nF CIN Sensor pin parasitic capacitance 4 pF NBITS Number of bits FDC2112, FDC2114 12 bits RCOUNT ≥ 0x0400 FDC2212, FDC2214 28 bits RCOUNT = 0xFFFF fCS Maximum channel sample rate FDC2112, FDC2114 single active channel continuous 13.3 kSPS conversion, SCL = 400 kHz FDC2212, FDC2214 single active channel continuous 4.08 kSPS conversion, SCL= 400 kHz EXCITATION fSENSOR Sensor excitation frequency TA = –40°C to +125°C 0.01 10 MHz VSENSORMIN Minimum sensor oscillation 1.2 V amplitude (pk)(7) VSENSORMAX Maximum sensor oscillation 1.8 V amplitude (pk) ISENSORMAX Sensor maximum current drive HIGH_CURRENT_DRV = b0 DRIVE_CURRENT_CH0 = 1.5 mA 0xF800 HIGH_CURRENT_DRV = b1 DRIVE_CURRENT_CH0 = 6 mA 0xF800 Channel 0 only MASTER CLOCK fCLKIN External master clock input TA = –40°C to +125°C 2 40 MHz frequency (CLKIN) CLKINDUTY_MIN External master clock minimum 40% acceptable duty cycle (CLKIN) CLKINDUTY_MAX External master clock maximum 60% acceptable duty cycle (CLKIN) VCLKIN_LO CLKIN low voltage threshold 0.3*VDD V (1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) Register values are represented as either binary (b is the prefix to the digits), or hexadecimal (0x is the prefix to the digits). Decimal values have no prefix. (3) Limits are ensured by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are ensured through correlations using statistical quality control (SQC) method. (4) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (5) I2C read/write communication and pull-up resistors current through SCL, SDA not included. (6) Sensor capacitor: 1 layer, 20.9 x 13.9 mm, Bourns CMH322522-180KL sensor inductor with L=18µH and 33pF 1% COG/NP0 Target: Grounded aluminum plate (176 x 123 mm), Channel = Channel 0 (continuous mode) CLKIN = 40 MHz, CHx_FIN_SEL = b10, CHx_FREF_DIVIDER = b00 0000 0001 CH0_RCOUNT = 0xFFFF, SETTLECOUNT_CH0 = 0x0100, DRIVE_CURRENT_CH0 = 0x7800. (7) Lower VSENSORMIN oscillation amplitudes can be used, but will result in lower SNR. 6 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Product Folder Links: FDC2212 FDC2214 FDC2112 FDC2114 |
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