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LM139AW-QMLV Datasheet(PDF) 6 Page - Texas Instruments |
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LM139AW-QMLV Datasheet(HTML) 6 Page - Texas Instruments |
6 / 29 page LM139AQML, LM139QML SNOSAH8G – FEBRUARY 2005 – REVISED MARCH 2013 www.ti.com LM139A SMD 5962–8773901 Electrical Characteristics DC Parameters (continued) The following conditions apply, unless otherwise specified. +V = 5V, VCM = 0V Symbol Parameter Conditions Sub- Notes Min Max Unit groups VCM Common Mode Voltage Range +V = 30V V+ - See(2) 0 V 1, 2, 3 (2.0) +V = 5V V+ - See(2) 0 V 1, 2, 3 (2.0) (2) Parameter ensured by VIO tests LM139A SMD 5962–8773901 Electrical Characteristics AC Parameters The following conditions apply, unless otherwise specified. +V = 5V Symbol Parameters Conditions Sub- Notes Min Max Unit groups tRLH Response Time VOD = 5mV, RL = 5.1KΩ 5.0 µS 9 tRHL Response Time VOD = 5mV, RL = 5.1KΩ 2.5 µS 9 LM139A 883, QMLV & RH, SMD 5962–9673801 Electrical Characteristics DC Parameters (1) (2) The following conditions apply, unless otherwise specified. +V = 5V, VCM = 0V Symbol Parameters Conditions Sub- Notes Min Max Unit groups ICC Supply Current RL = Infinity 2.0 mA 1, 2, 3 +V = 30V, RL = Infinity 2.0 mA 1, 2, 3 ICEX Output Leakage Current +V = 30V, VO = 30V 1.0 µA 1, 2, 3 VSat Saturation Voltage ISink = 4mA 400 mV 1 700 mV 2, 3 ISink Output Sink Current VO = 1.5V 6.0 mA 1 VIO Input Offset Voltage -2.0 2.0 mV 1 -4.0 4.0 mV 2, 3 +V = 30V -2.0 2.0 mV 1 -4.0 4.0 mV 2, 3 +V = 30V, VCM = 28.5V, -2.0 2.0 mV 1 VO = 1.5V +V = 30V, VCM = 28.0V, -4.0 4.0 mV 2, 3 VO = 1.5V ± IBias Input Bias Current VO = 1.5V See(3) -100 -1.0 nA 1 See(3) -300 -1.0 nA 2, 3 IIO Input Offset Current VO = 1.5V -25 25 nA 1 -100 100 nA 2, 3 PSRR Power Supply Rejection Ratio +V = 5V to 30V 60 dB 1 CMRR Common Mode Rejection Ratio +V = 30V, VCM = 0V to 28.5V 60 dB 1 AV Voltage Gain +V = 15V, RL ≥ 15KΩ, VO = 1V to 50 V/mV 1 11V (1) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the “Post Radiation Limits” table. These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are ensured only for the conditions as specified in Mil-Std-883, Method 1019, Condition A. (2) Low dose rate testing has been performed on a wafer-by-wafer basis, per test method 1019, condition D, MIL-STD-883, with no enhanced low dose rate sensitivity (ELDRS) effect. Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics, except as listed in the “Post Radiation Limits” table. Radiation end point limits for the noted parameters are ensured for only the conditions as specified in MIL-STD-883, Method 1019, condition D. (3) The direction of the input current is out of the IC due to the PNP input stage. This current is essentially constant, independent of the state of the output so no loading change exists on the reference or input lines. 6 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: LM139AQML LM139QML |
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