1

FEATURES

DCUPACKAGE

(TOP VIEW)

3

6

CLR

Q

8

1

V

CC

CLK

5

GND

4

Q

2

7

PRE

D

DESCRIPTION/ORDERING INFORMATION

SN74LVC2G74-EP

SINGLE POSITIVE EDGE TRIGGERED D-TYPE FLIP-FLOP

WITH CLEAR AND PRESET

• Controlled Baseline

• Inputs Accept Voltages to 5.5 V

–

One Assembly Site

• Max t

–

One Test Site

• Low Power Consumption, 10 µA Max I

CC

–

One Fabrication Site

• ±24 mA Output Drive at 3.3 V

• Extended Temperature Performance of –55°C

• Typical V

to 125

°C

• Enhanced Diminishing Manufacturing Sources

• Typical V

(DMS) Support

• Enhanced Product-Change Notification

• I

Operation

• Latch-Up Performance Exceeds 100 mA Per

• Supports 5-V V

JESD 78, Class II

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

• ESD Protection Exceeds JESD 22

extended temperature range. This includes, but is not limited

–

2000-V Human-Body Model (A114-A)

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

–

200-V Machine Model (A115-A)

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

–

1000-V Charged-Device Model (C101)

justifying use of this component beyond specified

performance and environmental limits.

A low level at the preset (PRE) or clear (CLR) input sets or resets the outputs, regardless of the levels of the

other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time

requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs

at a voltage level and is not related directly to the rise time of the clock pulse. Following the hold-time interval,

data at the D input can be changed without affecting the levels at the outputs.

preventing damaging current backflow through the device when it is powered down.

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2008, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.