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LMC6482 Datasheet(PDF) 4 Page - Texas Instruments |
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LMC6482 Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 39 page  LMC6482 SNOS674E – NOVEMBER 1997 – REVISED APRIL 2015 www.ti.com 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±1500 V (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT Supply Voltage 3 15.5 V LMC6482AM –55 125 °C Junction Temperature Range LMC6482AI, LMC6482I –40 −85 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 6.4 Thermal Information LMC6482 LMC6482 LMC6482 THERMAL METRIC(1) D (SOIC) DGK (VSSOP) P (PDIP) UNIT 8 PINS 8 PINS 8 PINS RθJA Junction-to-ambient thermal resistance 155 194 90 °C/W (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. 6.5 Electrical Characteristics for V + = 5 V Unless otherwise specified, all limits specified for TJ = 25°C, V + = 5 V, V− = 0 V, V CM = VO = V +/2 and R L > 1 M. At Temperature TJ = 25°C Extremes(1) PARAMETER TEST CONDITIONS UNIT MIN TYP(2) MAX(3) MIN TYP(2) MAX(3) DC Electrical Characteristics LMC6482AI 0.11 0.75 1.35 Input Offset VOS LMC6482I 0.11 3 3.7 mV Voltage LMC6482M 0.11 3 3.8 TCVOS Input Offset 1 Voltage μV/°C Average Drift LMC6482AI 0.02 4 IB Input Current See (4) LMC6482I 0.02 4 pA LMC6482M 0.02 10 LMC6482AI 0.01 2 Input Offset IOS See (4) LMC6482I 0.01 2 pA Current LMC6482M 0.01 5 CIN Common- 3 Mode Input pF Capacitance RIN Input 10 Tera Ω Resistance (1) See Recommended Operating Conditions for operating temperature ranges. (2) Typical Values represent the most likely parametric norm. (3) All limits are specified by testing or statistical analysis. (4) Ensured limits are dictated by tester limitations and not device performance. Actual performance is reflected in the typical value. 4 Submit Documentation Feedback Copyright © 1997–2015, Texas Instruments Incorporated Product Folder Links: LMC6482 |
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