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PCM2906 Datasheet(PDF) 2 Page - Texas Instruments |
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PCM2906 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 33 page www.ti.com ABSOLUTE MAXIMUM RATINGS PCM2904 PCM2906 SLES042C – JUNE 2002 – REVISED NOVEMBER 2007 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGING ORDERING INFORMATION SPECIFIED PACKAGE PACKAGE ORDERING TRANSPORT PRODUCT PACKAGE-LEAD TEMPERATURE DESIGNATOR MARKING NUMBER MEDIA RANGE PCM2904DB Rails PCM2904DB 28-lead SSOP 28DB –25 °C to 85°C PCM2904 PCM2904DBR Tape and reel PCM2906DB Rails PCM2906DB 28-lead SSOP 28DB –25 °C to 85°C PCM2906 PCM2906DBR Tape and reel over operating free-air temperature range (unless otherwise noted) (1) PCM2904/PCM2906 UNIT Supply voltage, VBUS –0.3 to 6.5 V Ground voltage differences, AGNDC, AGNDP, AGNDX, DGND, DGNDU ±0.1 V SEL0, SEL1, TEST0 (DIN)(2) –0.3 to 6.5 Digital input V voltage D+, D–, HID0, HID1, HID2, XTI, XTO, TEST1 (DOUT)(2), SSPND –0.3 to (VDDI + 0.3) < 4 VINL, VINR, VCOM, VOUTR, VOUTL –0.3 to (VCCCI + 0.3) < 4 Analog input V voltage VCCCI, VCCP1I, VCCP2I, VCCXI, VDDI –0.3 to 4 Input current (any pins except supplies) ±10 mA Ambient temperature under bias –40 to 125 °C Storage temperature, Tstg –55 to 150 °C Junction temperature, TJ 150 °C Lead temperature (soldering) 260 °C, 5 s Package temperature (IR reflow, peak) 250 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) ( ): PCM2906 2 Submit Documentation Feedback Copyright © 2002–2007, Texas Instruments Incorporated Product Folder Link(s): PCM2904 PCM2906 |
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