 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
LPV521 Datasheet(PDF) 6 Page - Texas Instruments |
|
|
||||||||||||||||||||||||||||||
LPV521 Datasheet(HTML) 6 Page - Texas Instruments |
|
|
6 / 34 page  LPV521 SNOSB14D – AUGUST 2009 – REVISED DECEMBER 2014 www.ti.com 6.7 3.3-V DC Electrical Characteristics Unless otherwise specified, all limits for TA = 25°C, V + = 3.3 V, V− = 0 V, V CM = VO = V +/2, and R L > 1 MΩ. (1) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOS Input Offset Voltage VCM = 0.3 V –1 0.1 1 Temperature extremes –1.23 1.23 mV VCM = 3 V –1 0.1 1 Temperature extremes –1.23 1.23 TCVOS Input Offset Voltage Drift(2) ±0.4 μV/°C Temperature extremes –3 3 IBIAS Input Bias Current –1 0.01 1 pA Temperature extremes –50 50 IOS Input Offset Current 20 fA CMRR Common Mode Rejection Ratio 0 V ≤ VCM ≤ 3.3 V 72 97 Temperature extremes 70 0 V ≤ VCM ≤ 2.2 V 78 106 dB Temperature extremes 75 2.7 V ≤ VCM ≤ 3.3 V 77 121 Temperature extremes 76 PSRR Power Supply Rejection Ratio 1.6 V ≤ V+ ≤ 5.5 V 109 85 VCM = 0.3 V dB Temperature extremes 76 CMRR ≥ 72 dB −0.1 3.4 CMRR ≥ 70 dB CMVR Common Mode Voltage Range V Temperature extremes 0 3.3 VO = 0.5 V to 2.8 V 120 82 RL = 100 kΩ to V +/2 AVOL Large Signal Voltage Gain dB Temperature extremes 76 VO Output Swing High RL = 100 kΩ to V +/2 3 50 VIN(diff) = 100 mV mV Temperature extremes 50 from either Output Swing Low RL = 100 kΩ to V +/2 2 rail 50 VIN(diff) = −100 mV Temperature extremes 50 IO Output Current(3) Sourcing, VO to V – 11 5 VIN(diff) = 100 mV Temperature extremes 4 mA Sinking, VO to V + 12 5 VIN(diff) = −100 mV Temperature extremes 4 IS Supply Current VCM = 0.3 V 346 400 Temperature extremes 600 nA VCM = 3 V 471 600 Temperature extremes 860 (1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) The offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change. (3) The short circuit test is a momentary open-loop test. 6 Submit Documentation Feedback Copyright © 2009–2014, Texas Instruments Incorporated Product Folder Links: LPV521 |
Similar Part No. - LPV521 |
|
Similar Description - LPV521 |
|
|
Link URL |
| Privacy Policy |
| ALLDATASHEET.NET |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
