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ABSOLUTE MAXIMUM RATINGS

TPS78601, TPS78618

TPS78625, TPS78628

TPS78630, TPS78633

SLVS389D – SEPTEMBER 2002 – REVISED OCTOBER 2004

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

TRANSPORT MEDIA,

PRODUCT

VOLTAGE

PACKAGE

SYMBOL

PART NUMBER

QUANTITY

TPS78601DCQ

Tube, 78

SOT223-6

PS78601

TPS78601

1.2 to 5.5 V

TPS78601DCQR

Tape and Reel, 2500

DDPAK

TPS78601

TPS78601KTT

Reel, 500

TPS78618DCQ

Tube, 78

SOT223-6

PS78618

TPS78618

1.8 V

TPS78618DCQR

Tape and Reel, 2500

DDPAK

TPS78618

TPS78618KTT

Reel, 500

TPS78625DCQ

Tube 78

SOT223-6

PS78625

TPS78625

2.5 V

TPS78625DCQR

Tape and Reel, 2500

DDPAK

TPS78625

TPS78625KTT

Reel, 500

-40

°C to 125°C

TPS78628DCQ

Tube 78

SOT223-6

PS78628

TPS78628

2.8 V

TPS78628DCQR

Tape and Reel, 2500

DDPAK

TPS78628

TPS78628KTT

Reel, 500

TPS78630DCQ

Tube 78

SOT223-6

PS78630

TPS78630

3.0 V

TPS78630DCQR

Tape and Reel, 2500

DDPAK

TPS78630

TPS78630KTT

Reel, 500

TPS78633DCQ

Tube 78

SOT223-6

PS78633

TPS78633

3.3 V

TPS78633DCQR

Tape and Reel, 2500

DDPAK

TPS78633

TPS78633KTT

Reel, 500

(1)

For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet.

VALUE

-0.3 V to 6 V

6 V

Peak output current

Internally limited

ESD rating, HBM

2 kV

ESD rating, CDM

500 V

Continuous total power dissipation

See Dissipation Ratings table

-40

°C to 150°C

-65

°C to 150°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2