LF411JAN

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SNOSAQ4A – OCTOBER 2005 – REVISED MARCH 2013

LF411JAN Low Offset, Low Drift JFET Input Operational Amplifier

Check for Samples: LF411JAN

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FEATURES

DESCRIPTION

This device is a low cost, high speed, JFET input

23

•

Internally Trimmed Offset Voltage: 0.5 mV(Typ)

operational amplifier with very low input offset voltage

•

Input Offset Voltage Drift: 30

μV/°C

and ensured input offset voltage drift. It requires low

•

Low Input Bias Current: 50 pA

supply current yet maintains a large gain bandwidth

product and fast slew rate. In addition, well matched

•

Low Input Noise Current: 0.01 pA/

√Hz

high voltage JFET input devices provide very low

•

Wide Gain Bandwidth: 3 MHz Typ.

input bias and offset currents. The LF411 is pin

•

High Slew Rate: 7V/

μs (Min.)

compatible

with

the

standard

LM741

allowing

designers

to

immediately

upgrade

the

overall

•

Low Supply Current: 1.8 mA

performance of existing designs.

•

Ω

This amplifier may be used in applications such as

•

high speed integrators, fast D/A converters, sample

and hold circuits and many other circuits requiring low

<0.02%

input offset voltage and drift, low input bias current,

•

Low 1/f Noise Corner: 50 Hz

high input impedance, high slew rate and wide

•

Fast Settling Time to 0.01%: 1.5

μs

bandwidth.

Typical Connection

Connection Diagram

Figure 1. 8LD Ceramic Dual-in Line Package

See Package Number NAB0008A (Top View)

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

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BI-FET II is a trademark of dcl_owner.

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All other trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2005–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.

Not Recommended For New Designs