Electronic Components Datasheet Search |
|
CL-L104-C3N-F Datasheet(PDF) 7 Page - CITIZEN ELECTRONICS CO., LTD. |
|
CL-L104-C3N-F Datasheet(HTML) 7 Page - CITIZEN ELECTRONICS CO., LTD. |
7 / 12 page 6/11 6. Reliability (1) Details of the tests (2) Judgment Criteria of Failure for Reliability Test (Ta=25 C) Symbol VF Φv U defines the upper limit of the specified characteristics. S defines the initial value. Symbol CITILED Name CL-L104-C3N-F Test Condition Measuring Condition Judgment Criteria for Failure > U × 1.1 < S × 0.85 Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be IF=350mA CITIZEN ELECTRONICS CO.,LTD. JAPAN Total Luminous Flux IF=350mA returned to the normal ambient conditions after the completion of each test. Thermal Shock Test 60 C, 90 %RH for 1000 hours Moisture-proof Test 100 C × 1000 hours High Temperature Storage Test -40 C × 30 minutes – 100 C × 30 minutes, 100 cycle -40 C × 1000 hours Ta=-30 C, IF=350 mA× 1000 hours(with Al-fin) Continuous Operation Test Measuring Item Forward Voltage Low Temperature Storage Test Ta=85 C, IF=350 mA× 1000 hours(with Al-fin) Ta=60 C, IF=350 mA× 1000 hours(with Al-fin) Test Item DATA SHEET Ref.CE-P2365 03/13 R1(0613) |
Similar Part No. - CL-L104-C3N-F |
|
Similar Description - CL-L104-C3N-F |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.NET |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |