TPS2306

DUAL SEQUENCING HOT SWAP POWER MANAGER

SLVS368 − APRIL 2001

6

POST OFFICE BOX 655303

ENBL input

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VIL

Input low voltage

0.8

V

VIH

Input high voltage

2

V

FAULT output

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

ILKG

Output leakage current

ENBL = 0 V,

VPULLUP = 5 V

1

µA

VOL

Ouput low voltage

ENBL = 5 V,

ISINK = 0.1 mA

0.5

V

ISINK

Output current sink

ENBL = 5 V,

VOL = 0.5 V

1

mA

charge pump

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VO

Maximum output voltage

ICPUMP = −25 µA

17

25

V

ISOURCE

Maximum current source

VCC= 5 V

−50

µA

ZO

Charge pump source impedance

VCC= 5 V,

(17 V

* 16 V)

(I(CP

+ 17 V) * I(CP + 16 V))

50

k

Ω

ramp-up comparator 1 and ramp-up comparator 2

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VUP

Trip threshold

1.35

1.5

1.65

V

ramp-down comparator 1 and ramp-down comparator 2

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VDN

Trip threshold

0.35

0.5

0.65

V

Terminal Functions

TERMINAL

I/O

DESCRIPTION

NAME

NO.

I/O

DESCRIPTION

CPUMP

12

O

Charge pump output

CS2

9

I

Channel 2 current sense input

CT

5

I/O

Fault timer capacitor pin

DOWN1

15

I

Ramp-down comparator input for channel 1

DOWN2

10

I

Ramp-down comparator input for channel 2

ENBL

3

I

Device enable input

FAULT

13

O

Active high fault indicator output

GATE1

14

O

Pass FET gate drive (output of LCA1)

GATE2

11

O

Pass FET gate drive (output of LCA2)

GND

6

−

Common ground connection for the IC

IMAX1

1

I

Maximum sourcing current programming input for channel 1

IMAX2

8

I

Maximum sourcing current programming input for channel 2

IREF

4

O

Reference current programming pin

UP1

2

I

Ramp-up comparator input for channel 1

UP2

7

I

Ramp-up comparator input for channel 2

VCC/CS1

16

I

Device supply input and channel 1 current sense input

NOTE: Connecting a scope probe or other metering device to the CT pin alters the fault time.