OPA322-Q1, OPA322S-Q1

OPA2322-Q1, OPA2322S-Q1

OPA4322-Q1, OPA4322S-Q1

SLOS856A – JUNE 2013 – REVISED JUNE 2013

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

OPA322-Q1, OPA322S-Q1, OPA2322-Q1,

OPA2322S-Q1, OPA4322-Q1, OPA4322S-Q1

UNIT

6

V

(V–) – 0.5 to (V+) + 0.5

V

Signal input pins

±10

mA

Continuous

mA

–40 to 125

°C

–65 to 150

°C

150

°C

Human-body model (HBM) AEC-Q100

4

kV

Classification Level H3A

ESD ratings

Charged-device model (CDM) AEC-Q100

1000

V

Classification Level C5

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute-maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails should

be current limited to 10 mA or less.

(3)

Short-circuit to ground, one amplifier per package.

2

Submit Documentation Feedback

Copyright © 2013, Texas Instruments Incorporated

Product Folder Links: OPA322-Q1 OPA322S-Q1 OPA2322-Q1 OPA2322S-Q1 OPA4322-Q1 OPA4322S-Q1