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OPA694IDRG4 Datasheet(PDF) 2 Page - Texas Instruments

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Part # OPA694IDRG4
Description  Wideband, Low-Power, Current Feedback Operational Amplifier
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

OPA694IDRG4 Datasheet(HTML) 2 Page - Texas Instruments

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8
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5
NC
InvertingInput
NoninvertingInput
-VS
NC
+VS
Output
NC
1
2
3
5
4
Output
-VS
NoninvertingInput
+V
S
InvertingInput
BIA
PinOrientation/PackageMarking
OPA694
SBOS319G – SEPTEMBER 2004 – REVISED JANUARY 2010
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
SPECIFIED
PACKAGE
TEMPERATURE
PACKAGE
ORDERING
TRANSPORT
PRODUCT
PACKAGE-LEAD
DESIGNATOR
RANGE
MARKING
NUMBER
MEDIA, QUANTITY
OPA694ID
Rails, 100
OPA694
SO-8
D
-40°C to +85°C
OPA694
OPA694IDR
Tape and Reel, 2500
OPA694IDBVT
Tape and Reel, 250
OPA694
SOT23-5
DBV
-40°C to +85°C
BIA
OPA694IDBVR
Tape and Reel, 3000
(1)
For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or see
the TI web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
OPA694
UNIT
Power Supply
±6.5
VDC
Internal Power Dissipation
See Thermal Characteristics
Differential Input Voltage
±1.2
V
Input Voltage Range
±VS
V
Storage Temperature Range: D, DBV
–65 to +125
°C
Junction Temperature (TJ)
+150
°C
Human Body Model (HBM)
1500
V
ESD Ratings:
Charge Device Model (CDM)
1000
V
Machine Model (MM)
100
V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
D PACKAGE
DRB PACKAGE
SO-8
SOT23-5
(TOP VIEW)
(TOP VIEW)
2
Copyright © 2004–2010, Texas Instruments Incorporated
Product Folder Link(s): OPA694


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