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ZGFM3027B Datasheet(PDF) 9 Page - Formosa MS |
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ZGFM3027B Datasheet(HTML) 9 Page - Formosa MS |
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9 / 9 page  Page 9 Formosa MS Chip Zener Diode http://www.formosams.com/ TEL:886-2-22696661 FAX:886-2-22696141 Document ID Issued Date Revised Date Revision Page. ZGFM306V8B THRU ZGFM30200B DS-121741 2009/08/10 2011/07/01 D 9 High reliability test capabilities 1. Solder Resistance 2. Solderability 3. High Temperature Reverse Bias 4. Pressure Cooker 5. Temperature Cycling 6. Humidity 7. High Temperature Storage Life at 260 5 for 10 2sec. at 245 5 for 5 sec. V = 80% at T =150 for 168 hrs. 15P at T =121 for 4 hrs. -55 to +125 dwelled for 30 min. and transferred for 5min. total 10 cycles. at T =85 , RH=85% for 1000hrs. at 175 for 1000 hrs. ±C ± ±C V Nom* C C CC C C O O O O OO O O ZJ SIG A A Z MIL-STD-750D METHOD-2031 MIL-STD-202F METHOD-208 MIL-STD-750D METHOD-1038 JESD22-A102 MIL-STD-750D METHOD-1051 MIL-STD-750D METHOD-1021 MIL-STD-750D METHOD-1031 Item Test Conditions Reference |
Similar Part No. - ZGFM3027B |
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Similar Description - ZGFM3027B |
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