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DS90CF583 Datasheet(PDF) 6 Page - National Semiconductor (TI) |
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DS90CF583 Datasheet(HTML) 6 Page - National Semiconductor (TI) |
6 / 12 page AC Timing Diagrams (Continued) Note 7: The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and CMOS/TTL I/O. Note 8: The 16 grayscale test pattern tests device power consumption for a “typical” LCD display pattern. The test pattern approximates signal switching needed to produce groups of 16 vertical stripes across the display. Note 9: Figure 1 and Figure 2 show a falling edge data strobe (TxCLK IN/RxCLK OUT). Note 10: Recommended pin to signal mapping. Customer may choose to define differently. DS012616-4 FIGURE 2. “16 Grayscale” Test Pattern DS012616-5 FIGURE 3. DS90CF583 (Transmitter) LVDS Output Load and Transition Times DS012616-6 FIGURE 4. DS90CF584 (Receiver) CMOS/TTL Output Load and Transition Times www.national.com 6 |
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Similar Description - DS90CF583 |
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