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SI9181DQ-25-T1-E3 Datasheet(PDF) 3 Page - Vishay Siliconix |
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SI9181DQ-25-T1-E3 Datasheet(HTML) 3 Page - Vishay Siliconix |
3 / 10 page Si9181 Vishay Siliconix Document Number: 71119 S-40694—Rev. D, 19-Apr-04 www.vishay.com 3 SPECIFICATIONS Test Conditions Unless Otherwise Specified V V 1 V I 1 A Limits −40 to 85_C Parameter Symbol VIN = VOUT(nom) + 1 V, IOUT = 1 mA CIN = 2.2 mF, COUT = 2.2 mF, VSD = 1.5 V Tempa Minb Typc Maxb Unit Shutdown Supply Current IIN(off) VSD = 0 V Room 0.1 1 mA ADJ Pin Current IADJ ADJ = 1.2 V Room 5 100 nA Peak Output Current IO(peak) VOUT w 0.95 x VOUT(nom), tpw = 2 ms Room 600 mA Output Noise Voltage eN BW = 50 Hz to 100 kHz w/o CNOISE Room 200 mV (rms) Output Noise Voltage eN BW = 50 Hz to 100 kHz IOUT = 150 mA CNOISE = 0.1 mF Room 100 mV (rms) f = 1 kHz Room 60 Ripple Rejection DVOUT/DVIN IOUT = 150 mA f = 10 kHz Room 60 dB pp j OUT IN OUT f = 100 kHz Room 40 Dynamic Line Regulation DVO(line) VIN : VOUT(nom) + 1 V to VOUT(nom) + 2 V tR/tF = 5 ms, IOUT = 350 mA Room 10 mV Dynamic Load Regulation DVO(load) IOUT : 1 mA to 150 mA, tR/tF = 2 ms Room 30 mV VOUT Turn On Time tON VIN = 4.3 V w/o CNOISE Cap Room 5 ms VOUT Turn-On-Time tON VIN = 4.3 V VOUT = 3.3 V CNOISE = 0.1 mF Room 2 mS Thermal Shutdown Thermal Shutdown Junction Temp tJ(s/d) Room 165 _C Thermal Hysteresis tHYST Room 20 _C Short Circuit Current ISC VOUT = 0 V Room 800 mA Shutdown Input SD Input Voltage VIH High = Regulator ON (Rising) Full 1.5 VIN V SD Input Voltage VIL Low = Regulator OFF (Falling) Full 0.4 V SD Input Currente IIH VSD = 0 V, Regulator OFF Room 0.01 mA SD Input Currente IIL VSD = 6 V, Regulator ON Room 1.0 mA Shutdown Hysteresis VHYST Full 100 mV Error Output Output High Leakage IOFF ERROR = VOUT(nom) Full 0.01 2 mA Output Low Voltageg VOL ISINK = 2 mA Full 0.4 Power_Good Trip Thresholdf, h (Rising) VTH Full 0.93 x VOUT 0.95 x VOUT 0.97 x VOUT V Hysteresisf VHYST Room 2% x VOUT Delay Pin Current Source IDELAY Room 1.2 2.2 3.0 mA Notes a. Room = 25_C, Full = −40 to 85_C. b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum. c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing. Typical values for dropout voltage at VOUT w 2 V are measured at VOUT = 3.3 V, while typical values for dropout voltage at VOUT < 2 V are measured at VOUT = 1.8 V. d. Dropout voltage is defined as the input to output differential voltage at which the output voltage drops 2% below the output voltage measured with a 1-V differential, provided that VIN does not not drop below 2.0 V. e. The device’s shutdown pin includes a typical 6-MW internal pull-down resistor connected to ground. f. VOUT is defined as the output voltage of the DUT at 1 mA. g. The Error Output (Low) function is guaranteed from VOUT = 2.0 V to VOUT = 5.0 V. h. The Power_Good trip threshold function is guaranteed from VOUT = 1.5 V to VOUT = 5.0 V and VIN w 2.0 V. |
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