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TPS73633-EP Datasheet(PDF) 1 Page - Texas Instruments |
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TPS73633-EP Datasheet(HTML) 1 Page - Texas Instruments |
1 / 27 page 1 FEATURES APPLICATIONS TPS736xx GND EN NR IN OUT V IN V OUT Optional Optional Optional Typical Application Circuit for Fixed-Voltage Versions N/C-Nointernalconnection TPS73601-EP, TPS73615-EP, TPS73618-EP TPS73625-EP, TPS73630-EP, TPS73632-EP, TPS73633-EP www.ti.com .................................................................................................................................................. SGLS326C – APRIL 2006 – REVISED FEBRUARY 2009 CAP-FREE NMOS 400 mA LOW-DROPOUT REGULATORS WITH REVERSE CURRENT PROTECTION – Adjustable Output from 1.2 V to 5.5 V 2 • Controlled Baseline – Custom Outputs Available – One Assembly – One Test Site • Portable/Battery-Powered Equipment – One Fabrication Site • Post-Regulation for Switching Supplies • Extended Temperature Performance of • Noise-Sensitive Circuitry Such as VCOs –55°C to 125°C • Point of Load Regulation for DSPs, FPGAs, • Enhanced Diminishing Manufacturing Sources ASICs, and Microprocessors (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) • Stable With No Output Capacitor or Any Value or Type of Capacitor • Input Voltage Range of 1.7 V to 5.5 V • Ultra-Low Dropout Voltage: 75 mV Typical • Excellent Load Transient Response—With or Without Optional Output Capacitor • New NMOS Topology Delivers Low Reverse Leakage Current • Low Noise: 30 µV RMS Typical (10 Hz to 100 kHz) • 0.5% Initial Accuracy • 1% Overall Accuracy Over Line, Load, and Temperature • Less Than 1-µA Max I Q in Shutdown Mode • Thermal Shutdown and Specified Min/Max Current Limit Protection • Available in Multiple Output Voltage Versions – Fixed Outputs of 1.2 V to 3.3 V (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Copyright © 2006–2009, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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