TPS78225-Q1, TPS78227-Q1

TPS78228-Q1, TPS78230-Q1

SBVS138 – DECEMBER 2009

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

TPS782xx

UNIT

–0.3 to +6.0

V

Enable

V

V

Internally limited

Output short-circuit duration

Indefinite

See the Dissipation Ratings table

Human body model (HBM)

2

kV

ESD rating

Charged device model (CDM)

500

V

–40 to 125

°C

–55 to +150

°C

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

DISSIPATION RATINGS

DERATING FACTOR

BOARD

PACKAGE

DRV

20°C/W

65°C/W

15.4 mW/°C

1540 mW

84 5mW

615 mW

(1)

The JEDEC high-K (2s2p) board used to derive this data was a 3-inch × 3-inch, multilayer board with 1-ounce internal power and

ground planes and 2-ounce copper traces on top and bottom of the board.

2

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Product Folder Link(s): TPS78225-Q1 TPS78227-Q1 TPS78228-Q1 TPS78230-Q1