6

Integrated Silicon Solution, Inc. — 1-800-379-4774

Rev. J

06/29/00

IS41C16256

IS41LV16256

(Recommended Operation Conditions unless otherwise noted.)

Symbol Parameter

Test Condition

Speed

Min.

Max.

Unit

Input Leakage Current

Any input 0V

–10

10

µA

Other inputs not under test = 0V

Output Leakage Current

Output is disabled (Hi-Z)

–10

10

µA

0V

Output High Voltage Level

2.4

—

V

Output Low Voltage Level

—

0.4

V

Stand-by Current: TTL

RAS, LCAS, UCAS

—

3mA

Industrial

5V

—

4

Commercial

3V

—

2

Industrial

3V

—

3

Stand-by Current: CMOS

RAS, LCAS, UCAS

5V

—

2mA

3V

—

1

Operating Current:

RAS, LCAS, UCAS,

-35

—

230

mA

-50

—

180

Average Power Supply Current

-60

—

170

Operating Current:

-35

—

220

mA

-50

—

170

Average Power Supply Current

-60

—

160

Refresh Current:

RAS Cycling, LCAS, UCAS

-35

—

230

mA

-50

—

180

Average Power Supply Current

-60

—

170

Refresh Current:

RAS, LCAS, UCAS Cycling

-35

—

230

mA

-50

—

180

Average Power Supply Current

-60

—

170

Notes:

1. An initial pause of 200 µs is required after power-up followed by eight

RAS refresh cycles (RAS-Only or CBR) before proper device

operation is assured. The eight

2. Dependent on cycle rates.

3. Specified values are obtained with minimum cycle time and the output open.

4. Column-address is changed once each EDO page cycle.

5. Enables on-chip refresh and address counters.