N34TS04

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2

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameter

Rating

Units

Operating Temperature

−45 to +130

°C

Storage Temperature

−65 to +150

°C

−0.5 to +6.5

V

−0.5 to +10.5

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

Table 2. RELIABILITY CHARACTERISTICS

Symbol

Parameter

Min

Units

Endurance (EEPROM)

1,000,000

Write Cycles

Data Retention (EEPROM)

100

Years

Parameter

Test Conditions/Comments

Max

Unit

Temperature Reading Error

+75

±1.0

°C

+40

±2.0

°C

−20

±3.0

°C

ADC Resolution

12

Bits

Temperature Resolution

0.0625

°C

Conversion Time

100

ms

Thermal Resistance (Note 3)

Junction−to−Ambient (Still Air)

92

°C/W

resistance value refers to the case of a package being used on a standard 2−layer PCB.

Symbol

Parameter

Test Conditions/Comments

Min

Max

Unit

Supply Current

TS active, SPD and Bus idle

1000

mA

SPD Write, TS shut−down

1000

mA

Standby Current

TS shut−down; SPD and Bus idle

10

mA

I/O Pin Leakage Current

2

mA

Input Low Voltage

−0.5

V

−0.05

Input High Voltage

V

Output Low Voltage

0.4

V

0.2

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product

performance may not be indicated by the Electrical Characteristics if operated under different conditions.