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S5D2650 Datasheet(PDF) 6 Page - Samsung semiconductor |
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S5D2650 Datasheet(HTML) 6 Page - Samsung semiconductor |
6 / 95 page ELECTRONICS S5D2650 Data Sheet MULTIMEDIA VIDEO PAGE 6 OF 95 7/18/03 TEST TEST0 29 I Test pin 0. For normal use, this pin should be connected to VSS. TEST1 30 I Test pin 1. For normal use, this pin should be connected to VSS. TEST2 57 I Test pin 2. For normal use, this pin should be connected to VSS. SCANEN 31 I SCAN Mode Test pin.For normal use, this pin should be connected to VSS. CKE 32 I For Test TBC function. For normal use, this pin should be connected to VSS. PIN DESCRIPTION (Continued) Pin Name Pin # Type Description |
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