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LM333T Datasheet(PDF) 7 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. LM333T
Description  3-Ampere Adjustable Negative Regulators
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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Typical Applications (Continued)
THERMAL REGULATION
When power is dissipated in an IC, a temperature gradient
occurs across the IC chip affecting the individual IC circuit
components. With an IC regulator, this gradient can be espe-
cially severe since the power dissipation is large. Thermal
regulation is the effect of these temperature gradients on
output voltage (in percentage output change) per watt of
power change in a specified time. Thermal regulation error is
independent of electrical regulation or temperature coeffi-
cient, and occurs within 5 ms to 50 ms after a change in
power dissipation. Thermal regulation depends on IC layout
as well as electrical design. The thermal regulation of a volt-
age regulator is defined as the percentage change of V
OUT,
per watt, within the first 10 ms after a step of power is ap-
plied. The LM133’s specification is 0.01%/W, max.
In
Figure 1, a typical LM133’s output drifts only 2 mV (or
0.02% of V
OUT = −10V) when a 20W pulse is applied for 10
ms. This performance is thus well inside the specification
limit of 0.01%/Wx20W = 0.2% max. When the 20W pulse is
ended, the thermal regulation again showsa2mV step as
the LM133 chip cools off. Note that the load regulation error
of about 1 mV (0.01%) is additional to the thermal regulation
error. In
Figure 2, when the 20W pulse is applied for 100 ms,
the output drifts only slightly beyond the drift in the first 10
ms, and the thermal error stays well within 0.1% (10 mV).
Adjustable Lab Voltage Regulator
DS009065-12
*The 10 µF capacitors are optional to improve ripple rejection.
Adjustable Current Regulator
DS009065-13
*0.5
Ω≤ R1 ≤ 24Ω
DS009065-14
FIGURE 1.
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