NB3F8L3010CMNTWG datasheet(6/13 Pages) ONSEMI

Part #	NB3F8L3010CMNTWG

Description	3:1:10 LVCMOS Fanout Buffer

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Manufacturer	ONSEMI [ON Semiconductor]

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NB3F8L3010C

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6

Table 11. AC CHARACTERISTICS VDD = 3.3 V ± 5% (3.135 V to 3.465 V) or VDD = 2.5 V ±5% (2.375 V to 2.625 V) and

VDDOn = 3.3 V ± 5% (3.135 V to 3.465 V) or 2.5 V ± 5% (2.375 V to 2.625 V) or 1.8 V ± 0.2 V (1.6 V to 2.0 V) or 1.5 V ± 0.15 V (1.35 V

to 1.65 V); TA = −40°C to 85°C

Symbol

Unit

Max

Typ

Min

Test Conditions

Parameter

tsk(o)

Output Skew (Notes 6 and 7)

10

55

ps

tJITTERF

Additive RMS

Phase Jitter

(Integrated

12 kHz

*

20 MHz)

(Note 8)

Input clock from

CLK0/CLK0 or

CLK1/CLK1

VDDOn = 3.3 V ± 5%

0.03

ps

VDDOn = 2.5 V ± 5%

0.03

VDDOn = 1.8 V ± 0.2 V

0.03

VDDOn = 1.5 V ± 0.15 V

0.03

External clock

over drives

crystal interface

VDDOn = 3.3 V ± 5%

0.03

VDDOn = 2.5 V ± 5%

0.03

VDDOn = 1.8 V ± 0.2 V

0.03

VDDOn = 1.5 V ± 0.15 V

0.03

Input clock from

crystal

VDDOn = 3.3 V ± 5%

0.03

VDDOn = 2.5 V ± 5%

0.03

VDDOn = 1.8 V ± 0.2 V

0.03

VDDOn = 1.5 V ± 0.15 V

0.03

tR / tF

Output Rise/Fall Time (20% and 80%)

VDDOn = 3.3 V ± 5%

150

350

500

ps

VDDOn = 2.5 V ± 5%

150

350

500

VDDOn = 1.8 V ± 0.2 V

150

350

600

VDDOn = 1.5 V ± 0.15 V

150

350

600

odc

Output Duty Cycle

VDDOn = 3.3 V ± 5%

45

55

%

VDDOn = 2.5 V ± 5%

40

60

VDDOn = 1.8 V ± 0.2 V

40

60

VDDOn = 1.5 V ± 0.15 V

40

60

tEN

Output Enable

Time (Note 9)

OE

4

cycles

tDIS

Output Disable

Time (Note 9)

OE

4

cycles

MUX_ISOLATION

155.52 MHz

55

dB

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm.

5. XTAL_IN can be overdriven relative to a signal a crystal would provide.

6. Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDOn/2.

7. This parameter is defined in accordance with JEDEC Standard 65.

8. See phase noise plot.

9. These parameters are guaranteed by characterization. Not tested in production. See Parameter Measurement Information

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