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NB3F8L3010CMNTWG Datasheet(PDF) 6 Page - ON Semiconductor |
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NB3F8L3010CMNTWG Datasheet(HTML) 6 Page - ON Semiconductor |
6 / 13 page NB3F8L3010C www.onsemi.com 6 Table 11. AC CHARACTERISTICS VDD = 3.3 V ± 5% (3.135 V to 3.465 V) or VDD = 2.5 V ±5% (2.375 V to 2.625 V) and VDDOn = 3.3 V ± 5% (3.135 V to 3.465 V) or 2.5 V ± 5% (2.375 V to 2.625 V) or 1.8 V ± 0.2 V (1.6 V to 2.0 V) or 1.5 V ± 0.15 V (1.35 V to 1.65 V); TA = −40°C to 85°C Symbol Unit Max Typ Min Test Conditions Parameter tsk(o) Output Skew (Notes 6 and 7) 10 55 ps tJITTERF Additive RMS Phase Jitter (Integrated 12 kHz * 20 MHz) (Note 8) Input clock from CLK0/CLK0 or CLK1/CLK1 VDDOn = 3.3 V ± 5% 0.03 ps VDDOn = 2.5 V ± 5% 0.03 VDDOn = 1.8 V ± 0.2 V 0.03 VDDOn = 1.5 V ± 0.15 V 0.03 External clock over drives crystal interface VDDOn = 3.3 V ± 5% 0.03 VDDOn = 2.5 V ± 5% 0.03 VDDOn = 1.8 V ± 0.2 V 0.03 VDDOn = 1.5 V ± 0.15 V 0.03 Input clock from crystal VDDOn = 3.3 V ± 5% 0.03 VDDOn = 2.5 V ± 5% 0.03 VDDOn = 1.8 V ± 0.2 V 0.03 VDDOn = 1.5 V ± 0.15 V 0.03 tR / tF Output Rise/Fall Time (20% and 80%) VDDOn = 3.3 V ± 5% 150 350 500 ps VDDOn = 2.5 V ± 5% 150 350 500 VDDOn = 1.8 V ± 0.2 V 150 350 600 VDDOn = 1.5 V ± 0.15 V 150 350 600 odc Output Duty Cycle VDDOn = 3.3 V ± 5% 45 55 % VDDOn = 2.5 V ± 5% 40 60 VDDOn = 1.8 V ± 0.2 V 40 60 VDDOn = 1.5 V ± 0.15 V 40 60 tEN Output Enable Time (Note 9) OE 4 cycles tDIS Output Disable Time (Note 9) OE 4 cycles MUX_ISOLATION MUX_ISOLATION 155.52 MHz 55 dB NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. 5. XTAL_IN can be overdriven relative to a signal a crystal would provide. 6. Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDOn/2. 7. This parameter is defined in accordance with JEDEC Standard 65. 8. See phase noise plot. 9. These parameters are guaranteed by characterization. Not tested in production. See Parameter Measurement Information |
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