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NB3N1900K Datasheet(PDF) 9 Page - ON Semiconductor

Part # NB3N1900K
Description  Differential 1:19 HCSL Clock ZDB/Fanout Buffer for PCIe
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NB3N1900K Datasheet(HTML) 9 Page - ON Semiconductor

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NB3N1900K
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Table 10. ELECTRICAL CHARACTERISTICS − CLOCK INPUT PARAMETERS
(VDD = VDDA = 3.3 V ±5%, TA = −10°C to +70°C), See Test Loads for Loading Conditions.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIHDIF
Input High Voltage − CLK_IN
(Note 9)
Differential inputs (single−ended
measurement)
600
1150
mV
VILDIF
Input Low Voltage − CLK_IN
(Note 9)
Differential inputs (single−ended
measurement)
VSS
300
300
mV
VCOM
Input Common Mode Voltage −
CLK_IN (Note 9)
Common Mode Input Voltage
300
1000
mV
VSWING
Input Amplitude − CLK_IN (Note 9)
Peak to Peak value
300
1450
mV
dv/dt
Input Slew Rate − CLK_IN (Notes 9
and 10)
Measured differentially
0.4
8
V/ns
IIN
Input Leakage Current (Note 9)
VIN = VDD, VIN = GND
−5
5
mA
dtin
Input Duty Cycle (Note 9)
Measurement from differential waveform
45
55
%
JDIFIn
Input Jitter − Cycle to Cycle (Note 9)
Differential Measurement
0
125
ps
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
9. Guaranteed by design and characterization, not tested in production.
10. Slew rate measured through
±75 mV window centered around differential zero.
Table 11. ELECTRICAL CHARACTERISTICS − DIF 0.7 V CURRENT MODE DIFFERENTIAL OUTPUTS
(VDD = VDDA = 3.3 V ±5%, TA = −10°C to +70°C), See Test Loads for Loading Conditions
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
dV/dt
Slew rate (Notes 11, 12 and 13)
Scope averaging on
1
4
V/ns
DdV/dt
Slew rate matching
(Notes 11, 12 and 14)
Slew rate matching, Scope averaging on
20
%
DTrf
Rise/Fall Time Matching
(Notes 11, 12 and 18)
Rise/fall matching, Scope averaging off
125
ps
VHigh
Voltage High (Note 11)
Statistical measurement on single−ended
signal using oscilloscope math function.
(Scope averaging on)
660
850
mV
VLow
Voltage Low (Note 11)
−150
150
Vmax
Max Voltage (Note 11)
Measurement on single ended signal using
Absolute value. (Scope averaging off)
1150
mV
Vmin
Min Voltage (Note 11)
−300
Vswing
Vswing (Notes 11 and 12)
Scope averaging off
300
mV
Vcross_abs
Crossing Voltage (abs)
(Notes 11 and 15)
Scope averaging off
250
550
mV
DVcross
Crossing Voltage (var)
(Notes 11 and 16)
Scope averaging off
140
mV
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
11. Guaranteed by design and characterization, not tested in production. IREF = VDD/(3xRREF). For RREF = 475 W (1%), IREF = 2.32 mA. IOH
= 6 x IREF and VOH = 0.7 V @ ZO = 50 W (100 W differential impedance).
12. Measured from differential waveform.
13. Slew rate is measured through the Vswing voltage range centered around differential 0 V. This results in a
±150 mV window around
differential 0 V.
14. Matching applies to rising and falling edge rate of differential waveform. It is measured using a
±75 mV window centered on the average cross
point where the clock rising meets clock# falling. The median cross point is used to calculate voltage thresholds that the oscilloscope uses
to calculate the slew rate. Measurement taken using a 100
W differential impedance 5” trace PCB.
15. Vcross is defined as voltage where Clock = Clock# measured on a component test board and only applies to the differential rising edge (i.e.
Clock rising and Clock# falling).
16. The total variation of all Vcross measurements in any particular system. Note that this is a subset of V_cross_min/max (V_cross absolute)
allowed. The intent is to limit Vcross induced modulation by setting V_cross_delta to be smaller than V_cross absolute.
17. Measured from single−ended waveform
18. Measured with scope averaging off, using statistics function. Variation is difference between min and max.


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