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CAT5401WI00 Datasheet(PDF) 6 Page - ON Semiconductor

Part # CAT5401WI00
Description  Quad Digital Potentiometer (POT)
Download  15 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

CAT5401WI00 Datasheet(HTML) 6 Page - ON Semiconductor

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Table 7. A.C. CHARACTERISTICS (Over recommended operating conditions unless otherwise stated.)
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
tSU
Data Setup Time
CL = 50 pF
50
ns
tH
Data Hold Time
50
ns
tWH
SCK High Time
125
ns
tWL
SCK Low Time
125
ns
fSCK
Clock Frequency
DC
3
MHz
tLZ
HOLD to Output Low Z
50
ns
tRI (Note 8)
Input Rise Time
2
ms
tFI (Note 8)
Input Fall Time
2
ms
tHD
HOLD Setup Time
100
ns
tCD
HOLD Hold Time
100
ns
tV
Output Valid from Clock Low
250
ns
tHO
Output Hold Time
0
ns
tDIS
Output Disable Time
250
ns
tHZ
HOLD to Output High Z
100
ns
tCS
CS High Time
250
ns
tCSS
CS Setup Time
250
ns
tCSH
CS Hold Time
250
ns
Table 8. POWER UP TIMING (Notes 8, 9)
Symbol
Parameter
Max
Units
tPUR
Power-up to Read Operation
1
ms
tPUW
Power-up to Write Operation
1
ms
8. This parameter is tested initially and after a design or process change that affects the parameter.
9. tPUR and tPUW are delays required from the time VCC is stable until the specified operation can be initiated.
Table 9. WRITE CYCLE LIMITS
Symbol
Parameter
Max
Units
tWR
Write Cycle Time
5
ms
Table 10. RELIABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Max
Units
NEND (Note 10)
Endurance
MIL−STD−883, Test Method 1033
1,000,000
Cycles/Byte
TDR (Note 10)
Data Retention
MIL−STD−883, Test Method 1008
100
Years
VZAP (Note 10)
ESD Susceptibility
MIL−STD−883, Test Method 3015
2000
V
ILTH (Note 10)
Latch-up
JEDEC Standard 17
100
mA


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