Electronic Components Datasheet Search |
|
S29GL01GT11DHVyyx Datasheet(PDF) 1 Page - Cypress Semiconductor |
|
S29GL01GT11DHVyyx Datasheet(HTML) 1 Page - Cypress Semiconductor |
1 / 105 page Cypress Semiconductor Corporation • 198 Champion Court • San Jose , CA 95134-1709 • 408-943-2600 Document Number: 002-00247 Rev. *G Revised October 27, 2016 S29GL01GT, S29GL512T 1 Gbit (128 Mbyte), 512 Mbit (64 Mbyte) GL-T MirrorBit® Eclipse™ Flash General Description The Cypress® S29GL01GT/512T are MirrorBit® Eclipse™ flash products fabricated on 45 nm process technology. These devices offer a fast page access time as fast as 15 ns, with a corresponding random access time as fast as 100 ns. They feature a Write Buffer that allows a maximum of 256 words/512 bytes to be programmed in one operation, resulting in faster effective programming time than standard programming algorithms. This makes these devices ideal for today’s embedded applications that require higher density, better performance, and lower power consumption. Distinctive Characteristics 45 nm MirrorBit Eclipse Technology Single supply (VCC) for read / program / erase (2.7 V to 3.6 V) Versatile I/O feature – Wide I/O voltage range (VIO): 1.65 V to VCC x8/x16 data bus Asynchronous 32-byte Page read 512-byte Programming Buffer – Programming in Page multiples, up to a maximum of 512 bytes Single word and multiple program on same word options Automatic Error Checking and Correction (ECC) — internal hardware ECC with single bit error correction Sector Erase – Uniform 128-kbyte sectors Suspend and Resume commands for Program and Erase operations Status Register, Data Polling, and Ready/Busy pin methods to determine device status Advanced Sector Protection (ASP) – Volatile and non-volatile protection methods for each sector Separate 2048-byte One Time Program (OTP) array – Four lockable regions (SSR0 - SSR3) – SSR0 is Factory Locked – SSR3 is Password Read Protect Common Flash Interface (CFI) parameter table Temperature Range / Grade: – Industrial ( 40 °C to +85 °C) – Industrial Plus ( 40 °C to +105 °C) – Extended ( 40 °C to +125 °C) – Automotive, AEC-Q100 Grade 3 (–40 °C to +85 °C) – Automotive, AEC-Q100 Grade 2 (–40 °C to +105 °C) 100,000 Program / Erase Cycles 20-year data retention Packaging Options – 56-pin TSOP – 64-ball LAA Fortified BGA, 13 mm 11 mm – 64-ball LAE Fortified BGA, 9 mm 9 mm – 56-ball VBU Fortified BGA, 9 mm 7 mm |
Similar Part No. - S29GL01GT11DHVyyx |
|
Similar Description - S29GL01GT11DHVyyx |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.NET |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |