Contents

General Description .............. 3

Speciication .................... 5

Switching Matrix Subsystem ....... 6

DC Measurement Subsystem ..... 10

Capacitance Measurement

Subsystem ..................... 16

Pulse Force Unit ................ 19

Software ...................... 20

General Speciications ........... 21

Recommended Conditions for

Ultra-Low Current and Low

Voltage Measurements ........... 22

Introduction

The Keysight Technologies, Inc. 4082F lash memory cell parametric test system is

designed to perform fast and precise DC measurements, capacitance measurements,

lash cell test and other high frequency applications such as ring oscillator measure-

ment. The system supports up to eight source monitor units (SMUs). Each SMU is

self-calibrating, and can be individually conigured to force either current or voltage,

as well as simultaneously measure either current or voltage. The system also sup-

ports a fully guarded switching matrix customizable from 12 to 48 pins. One special

additional pin is dedicated as a chuck connection.

The 4082F comes standard with a semiconductor pulse generator unit (SPGU)

mainframe that supports up to ive high-voltage SPGUs (HV-SPGUs). An optional

Keysight 4082F lash memory cell parametric test system high-frequency switching

matrix with integrated semiconductor pulse generator unit control is also available.

The HF matrix is organized as two 3 x 24 matrices (six inputs in total), and 1 TO 2

furnished cables may be used on each matrix pair to create a 3 x 48 matrix (three

inputs in total). The system also has one 1.6 A ground unit.