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TMS28F020-10 Datasheet(PDF) 1 Page - Texas Instruments |
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TMS28F020-10 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 21 page TMS28F020 262144 BY 8-BIT FLASH MEMORY SMJS020C – OCTOBER 1994 – REVISED JANUARY 1998 1 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 D Organization...262144 by 8-Bits D Pin Compatible With Existing 2-Megabit EPROMs D VCC Tolerance ±10% D All Inputs/Outputs TTL Compatible D Maximum Access/Minimum Cycle Time ’28F020-10 100 ns ’28F020-12 120 ns ’28F020-15 150 ns ’28F020-17 170 ns D Industry-Standard Programming Algorithm D 100000 and 10000 Program/Erase-Cycle Versions Available D Latchup Immunity of 250 mA on All Input and Output Lines D Low Power Dissipation (VCC = 5.5 V) – Active Write . . . 55 mW – Active Read... 165 mW – Electrical Erase... 82.5 mW – Standby... 0.55 mW (CMOS-Input Levels) D Automotive Temperature Range – 40 °C to 125°C description The TMS28F020 flash memory is a 262 144 by 8-bit (2 097 152-bit), programmable read-only memory that can be electrically bulk-erased and reprogrammed. It is available in 100 000 and 10 000 program/erase-endurance-cycle versions. The TMS28F020 is offered in a 32-lead plastic leaded chip-carrier package using 1,25-mm (50-mil) lead spacing (FM suffix) and a 32-lead thin small-outline package (DD suffix). Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. A0 – A17 Address Inputs DQ0 – DQ7 Inputs (programming) / Outputs E Chip Enable G Output Enable VCC 5-V Power Supply VPP 12-V Power Supply VSS Ground W Write Enable PIN NOMENCLATURE 32 1 32 31 14 5 6 7 8 9 10 11 12 13 29 28 27 26 25 24 23 22 21 A14 A13 A8 A9 A11 G A10 E DQ7 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 430 15 16 17 18 19 FM PACKAGE ( TOP VIEW ) 20 PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 1998, Texas Instruments Incorporated |
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