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MIC5012BWM Datasheet(PDF) 3 Page - Micrel Semiconductor |
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MIC5012BWM Datasheet(HTML) 3 Page - Micrel Semiconductor |
3 / 9 page MIC5012 Micrel 5-116 April 1998 Electrical Characteristics (Note 3) Test circuit. T A = –55°C to +125°C, V + = 15V, all switches open, unless otherwise specified. Parameter Conditions Min Typical Max Units Supply Current V+ = 32V V IN = 0V, S2 closed 0.1 10 µA (per section) V IN = VS = 32V 8 20 mA V+ = 5V V IN = 5V, S2 closed 1.6 4 mA Logic Input Voltage V+ = 4.75V Adjust V IN for VGATE low 2 V Adjust V IN for VGATE high 4.5 V V+ = 15V Adjust V IN for VGATE high 5.0 V Logic Input Current, I 2 V+ = 32V V IN = 0V –1 µA V IN = 32V 1 µA Input Capacitance Pins 11, 14 5 pF Gate Drive, V GATE S1, S2 closed, V+ = 4.75V, I GATE = 0, VIN = 4.5V 7 10 V V S = V+, VIN = 5V V+ = 15V, I GATE = 100µA, VIN = 5V 24 27 V Zener Clamp, S2 closed, V IN = 5V V+ = 15V, V S = 15V 11 12.5 15 V V GATE – VSOURCE V+ = 32V, V S = 32V 11 13 16 V Gate Turn-on Time, t ON V IN switched from 0 to 5V; measure time 60 200 µs (Note 4) for V GATE to reach 20V Gate Turn-off Time, t OFF V IN switched from 5 to 0V; measure time 4 10 µs for V GATE to reach 1V Note 1 Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical specifications do not apply when operating the device beyond its specified Operating Ratings. Note 2 The MIC5012 is ESD sensitive. Note 3 Minimum and maximum Electrical Characteristics are 100% tested at T A = 25°C and TA = 85°C, and 100% guaranteed over the entire range. Typicals are characterized at 25 °C and represent the most likely parametric norm. Note 4 Test conditions reflect worst case high-side driver performance. Low-side and bootstrapped topologies are significantly faster—see Applications Information. Maximum value of switching speed seen at 125 °C, units operated at room temperature will reflect the typical values shown. Test Circuit Input Source Gate 1/2 MIC5012 V+ Gnd V+ + 1µF VS S2 1nF I S1 500 Ω 1W VIN VGATE GATE |
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