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SAP5SD-A-G1-R Datasheet(PDF) 10 Page - Integrated Device Technology |
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SAP5SD-A-G1-R Datasheet(HTML) 10 Page - Integrated Device Technology |
10 / 66 page SAP51 / SAP5S Datasheet © 2016 Integrated Device Technology, Inc. 10 January 28, 2016 2.4. Quality Standards The quality of the SAP51/SAP5S will be ensured according to the IDT quality standards. IDT is a qualified supplier according to ISO/TS 16949:2002 and ISO 14001:1996. The following IDT reference documents apply for the development process (available on request; see section 9): • Management Regulation: 0410 Product Development Procedure • Process Specification: IDT C7D 0.6µm Technology Functional device parameters are valid for the device operating conditions specified in section 2.2. Production device tests are performed within the recommended ranges of VLTGP - VLTGN, Tamb = +25°C (+85°C and -25°C on sample basis only) unless otherwise stated. 2.5. Failure Rate Symbol Parameter Max. Unit AQL Acceptance Quality Level 0.1 % F55 Failure Rate at 55°C 18 FIT F70 Failure Rate at 70°C 60 FIT F85 Failure Rate at 85°C 150 FIT F125 Failure Rate at 125°C 1400 FIT 2.6. Humidity Class Level 3 humidity tolerance according to JEDEC-020D is guaranteed. |
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