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NLX2G08MUTCG Datasheet(PDF) 2 Page - ON Semiconductor

Part # NLX2G08MUTCG
Description  Dual 2-Input AND Gate
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NLX2G08MUTCG Datasheet(HTML) 2 Page - ON Semiconductor

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NLX2G08
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2
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage
*0.5 to +7.0
V
VIN
DC Input Voltage
*0.5 to +7.0
V
VOUT
DC Output Voltage
*0.5 to VCC + 0.5
V
IIK
DC Input Diode Current
VIN < GND
*50
mA
IOK
DC Output Diode Current
VOUT < GND
*50
mA
IO
DC Output Source/Sink Current
$50
mA
ICC
DC Supply Current per Supply Pin
$100
mA
IGND
DC Ground Current per Ground Pin
$100
mA
TSTG
Storage Temperature Range
*65 to )150
°C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
TBD
°C
TJ
Junction Temperature Under Bias
TBD
°C
qJA
Thermal Resistance (Note 1)
TBD
°C/W
PD
Power Dissipation in Still Air at 85
°C
TBD
mW
MSL
Moisture Sensitivity
Level 1
FR
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
TBD
TBD
N/A
V
ILatchup
Latchup Performance Above VCC and Below GND at 125°C
(Note 5)
$500
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
Power DC Supply Voltage
Operating
Data Retention Only
1.65
1.5
5.5
5.5
V
VIN
Digital Input Voltage (Note 6)
0
5.5
V
VOUT
Output Voltage
0
VCC
V
TA
Operating Free−Air Temperature
−55
+125
°C
Dt/DV
Input Transition Rise or Fall Rate
VCC = 1.8 V $0.15 V
VCC = 2.5 V $0.2 V
VCC = 3.3 V $0.3 V
VCC = 5.0 V $0.5 V
0
0
0
0
20
20
10
5
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
6. Unused inputs may not be left open. All inputs must be tied to a high− or low−logic input voltage level.


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