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MC74LVXU04DR2G Datasheet(PDF) 2 Page - ON Semiconductor |
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MC74LVXU04DR2G Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 6 page MC74LVXU04 http://onsemi.com 2 MAXIMUM RATINGS Symbol Parameter Value Unit VCC DC Supply Voltage −0.5 to +7.0 V VIN DC Input Voltage −0.5 to +7.0 V VOUT DC Output Voltage −0.5 to VCC + 0.5 V IIK DC Input Diode Current VI < GND −20 mA IOK DC Output Diode Current VO < GND ±20 mA IOUT DC Output Sink Current ±25 mA ICC DC Supply Current per Supply Pin ±50 mA TSTG Storage Temperature Range −65 to +150 _C TL Lead Temperature, 1 mm from Case for 10 Seconds 260 _C TJ Junction Temperature under Bias +150 _C qJA Thermal Resistance SOIC TSSOP 250 _C/W PD Power Dissipation in Still Air at 85 _CSOIC TSSOP 250 mW MSL Moisture Sensitivity Level 1 FR Flammability Rating Oxygen Index: 30% − 35% UL 94−V0 @ 0.125 in VESD ESD Withstand Voltage Human Body Model (Note 1) Machine Model (Note 2) Charged Device Model (Note 3) > 2000 > 200 2000 V ILatchup Latchup Performance Above VCC and Below GND at 85_C (Note 4) ±300 mA Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Tested to EIA/JESD22−A114−A. 2. Tested to EIA/JESD22−A115−A. 3. Tested to JESD22−C101−A. 4. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Max Unit VCC Supply Voltage 2.0 3.6 V VI Input Voltage (Note 5) 0 5.5 V VO Output Voltage (HIGH or LOW State) 0 VCC V TA Operating Free−Air Temperature −40 +85 _C Dt/DV Input Transition Rise or Fall Rate VCC = 3.0 V ± 0.3 V 0 100 ns/V Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. 5. Unused inputs may not be left open. All inputs must be tied to a high− or low−logic input voltage level. |
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