MC74LVX374

http://onsemi.com

5

Figure 2.

Figure 3.

Figure 4.

SWITCHING WAVEFORMS

*Includes all probe and jig capacitance

TEST POINT

DEVICE

UNDER

TEST

OUTPUT

*Includes all probe and jig capacitance

TEST POINT

DEVICE

UNDER

TEST

OUTPUT

CONNECT TO GND WHEN

1 k

W

TEST CIRCUITS

Figure 5. Propagation Delay Test Circuit

Figure 6. Three−State Test Circuit

GND

50%

CP

O

50%

OE

O

GND

HIGH

IMPEDANCE

HIGH

IMPEDANCE

50%

D

CP

GND

GND

VALID

50%

O

ORDERING INFORMATION

Device

Package

MC74LVX374DWR2G

SOIC−20

(Pb−Free)

1000 Tape & Reel

MC74LVX374DTR2G

TSSOP−20

(Pb−Free)

2500 Tape & Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging

Specifications Brochure, BRD8011/D.