6.42

IDT7035S/L

High-Speed 8K x 18 Dual-Port Static RAM

Industrial and Commercial Temperature Ranges

6

AC Test Conditions

Figure 2. Output Test Load

* including scope and jig.

Data Retention Waveform

Data retention Characteristics Over All Temperature Ranges

NOTES:

3. This parameter is guaranteed by characterization, but is not production tested.

4. At Vcc < 2.0V input leakages are undefined.

Figure 1. AC Output Test Load

DATA RETENTION MODE

CE

4088 drw 03

4.5V

4.5V

2V

≥

4088 drw 04

893

Ω

30pF

347

Ω

5V

BUSY

INT

893

Ω

5pF*

347

Ω

5V

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

5ns Max.

1.5V

1.5V

Figures 1 and 2

4088 tbl 11

Symbol

Parameter

Test Condition

Min.

Max.

Unit

2.0

___

___

V

Data Retention Current

CE

IND.

___

100

4000

µA

COM'L.

___

100

1500

Chip Deselect to Data Retention Time

SEM

0

___

___

ns

Operation Recovery Time

___

___

ns

4088 tbl 10